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Displaying 40476 - 40500 of 74099

Calibration and Characterization of Trap Detector Filter Radiometers

November 1, 2003
Author(s)
David W. Allen, George P. Eppeldauer, Steven W. Brown, E A. Early, Bettye C. Johnson, Keith R. Lykke
We describe the development of a mechanically simple, radiometrically stable transfer radiometer designed for both radiance and irradiance measurements. The filter radiometer consists of a six-element Si trap detector, a temperature stabilized filter wheel

Certification of a Polystyrene Synthetic Polymer, SRM 2888

November 1, 2003
Author(s)
Charles M. Guttman, William R. Blair, B M. Fanconi, R J. Goldschmidt, William E. Wallace, S Wetzel, David L. VanderHart
The certification of a polystyrene standard reference material, SRM 2888, is described. The M w of SRM 2888 was determined by light scattering to be 7.19 x 10 +3 g/mol with a sample standard deviation of 0.14 x 10 +3 g/mol. A combined expanded uncertainty

Certification of the Rheological Behavior of SRM 2491, Polydimethylsiloxane

November 1, 2003
Author(s)
Carl R. Schultesiz, Kathleen M. Flynn, Stefan D. Leigh
The certification of the rheological properties of Standard Reference Material (SRM) 2491, a non-Newtonian fluid consisting of polydimethylsiloxane, is described. The viscosity and the first normal stress difference were measured in steady shear at rates

Characterizing Surface Roughness of Thin Films by Polarized Light Scattering

November 1, 2003
Author(s)
Thomas A. Germer, Michael J. Fasolka
The polarization of light scattered by the surface of a material contains information that can be used to identify the sources of that scatter. In this paper, first order vector perturbation theory for light scattering from interfacial roughness of a

Comparison of Laser-Based and Conventional Calibrations of Sun Photometers

November 1, 2003
Author(s)
N Souaidia, C Pietras, G Fargion, R Barnes, R Frouin, Keith R. Lykke, Bettye C. Johnson, Steven W. Brown
Sun photometers are used to characterize the radiative properties of the atmosphere. They measure both the incident solar irradiance as well as the sky radiance (from scattered incident flux). Global networks of sun photometers provide data products such

Cross Sections for K-Shell Ionization of Atoms by Electron Impact

November 1, 2003
Author(s)
J P. Santos, F Parente, Yong Sik Kim
The relativistic version of the binary-encounter-Bethe (BEB) model is used to calculate cross sections for K-shell ionization of atoms by electron impact. The BEB model requires only two atomic constants, the binding energy and kinetic energy of the K

Defining Flashover for Fire Hazard Calculations: Part II

November 1, 2003
Author(s)
V Babrauskas, Richard Peacock
Comparison of available correlations and predictive models used to predict the minimum energy necessary to cause flashover show consistent estimates for a range of empirical data. Still, available experimental data show a wide range of heat release rates

Discussion of Definition of Wind Profiles in ASCE 7 by Yin Zhou and Ahsan Kareem

November 1, 2003
Author(s)
Emil Simiu, Fahim Sadek, Michael A. Riley
The discussion presents a critique of a paper published in the Journal of Structural Engineering, Aug. 2002, pp. 1082-1086. The main points of the discussion are: (1) the ASCE Standard definition of wind profiles is inconsistent with the ASCE definition of

Elastic Constants of Layers in Isotropic Laminates

November 1, 2003
Author(s)
F Hayliger, H M. Ledbetter, Sudook A. Kim, Ivar E. Reimanis
We determined the individual laminae elastic constants in multilayer laminates composed of dissimilar isotropic layers using acoustic resonance spectroscopy and the linear theory of elasticity. Resonant ultrasound allows one to measure the free-vibration

Enemies at the Gates: Securing the BACnet building

November 1, 2003
Author(s)
David G. Holmberg
This article seeks to increase awareness of the threats associated with connecting the building control system (specifically a BACnet system) to a wider network. In addition, it presents countermeasures available for addressing security threats

Exploring and Extending the Limits of CD-SEMs' Resolution

November 1, 2003
Author(s)
Andras Vladar, Michael T. Postek, John S. Villarrubia
This study of SEM resolution is occasioned by concerns that it is no longer adequate for lithography process control in integrated circuit manufacturing. For example, according to the most recent International Technology Roadmap for Semiconductors, the in

Extinction Near-Field Optical Microscopy

November 1, 2003
Author(s)
H F. Hamann, M Larbadi, S Barzen, T Brown, Alan Gallagher, David Nesbitt
Two AFM-assisted, apertureless, optical-imaging methods are presented. These overcome the severe resolution consrtaints of aperture-based Near-field Scanning Optical Microscopy by probing the highly localized mutual near-field interaction between AFM-tip

Fundamental Electron Interactions with Plasma Processing Gases

November 1, 2003
Author(s)
Loucas G. Christophorou, James K. Olthoff
This volume deals with the basic knowledge and undestanding of fundamtal interactions of low energy electrons with molecules. It provides an up-to-date and comprehensive account of the fundamental interactions of low energy energy electrons with molecules

High Frequency Loss Mechanism in Polymers Filled With Dielectric Modifiers

November 1, 2003
Author(s)
Jan Obrzut, A Anopchenko, K Kano, Haonan Wang
We analyzed the high frequency dielectric relaxation mechanism in high-k composite materials using film substrates made of low loss organic resin filled with ferrolectric ceramics and with single wall carbon nanotubes (SWNT). The highest frequencey
Displaying 40476 - 40500 of 74099
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