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Search Publications

NIST Authors in Bold

Displaying 39451 - 39475 of 73960

DOM Test Suite Methodology

February 1, 2004
Author(s)
D Dimiradis
Our results extending Kuhn's fault class hierarchy provide a justification for the focus of fault-based testing strategies on detecting particular faults and ignoring others. We develop a novel analytical technique that allows us to elegantly prove that

Dynamical Adhesion Force of Cells on Biomaterial Substrates

February 1, 2004
Author(s)
Y N. Deng, Carl Simon Jr., P M. McGuiggan, Sheldon M. Wiederhorn, Brian R. Lawn
The adhesion of cells to synthetic biomaterial implant surfaces is an essential step for tissue growth in bone repair. Such adhesion can mandate whether the tissue will accept or reject the implanted biomaterials. In this study, the adhesion forces between

Effects of Materials Chemistry and Morphology on Conductometric Sensor Signals

February 1, 2004
Author(s)
Douglas C. Meier, Stephen Semancik
Observation of conductance changes in material films upon their interactions with gas phase molecules is the basis of operation of the chemical microsensors being developed in the Chemical Sciences and Technology Laboratory at NIST. These interactions are

Elastic Flow Instability, Curved Streamlines and Mixing in Microfluidic Flows

February 1, 2004
Author(s)
Jai A. Pathak, David J. Ross, Kalman D. Migler
Flow instabilities are well known to occur in macroscopic flows when elastic fluids flow along curved streamlines. In this work we use flow visualization to study the mechanism underlying a purely elastic flow instability for Poiseuille flow in a micro (m)

Electronics Interconnections for Extreme Environments

February 1, 2004
Author(s)
George G. Harman
This article discusses the requirements for wire-bond and flip-chip interconnections that can be used in packaging semiconductor devices for extreme high and low temperature environments [from +460 'C (HTE) down to -200 'C (LTE)]. Active devices capable of

Engineering the Electrochromism of Layer-by-Layer Assembled Films

February 1, 2004
Author(s)
Dean M. DeLongchamp, P T. Hammond
This work applies the processing technique of layer-by-layer (LBL) assembly to the creation and development of new electrochemically-active composites. Layer-by-layer assembly is a type of assisted self-assembly that can create macromolecular complex films

Face Recognition Vendor Test 2002 Supplemental Report

February 1, 2004
Author(s)
Patrick J. Grother
Further analyses of the systems tested in the Face Recognition Vendor Test 2002 are reported. These supplement those covered in the primary Evaluation Report of March 2003. Specifically this report is intended to appeal to a more specialized audience; it

Field Measurements of State of Polarization and PMD from a Tier-1 Carrier

February 1, 2004
Author(s)
D Peterson, Paul Leo, Kent B. Rochford
Field measurements of the state of polarization in buried and aerial transmission fiber are presented and analyzed. State of polarization changes measured under field conditions are compared to the state of polarization changes generated by commercially

Flame Retardant Mechanism of Polyamid 6 - Clay Nanocompsoites

February 1, 2004
Author(s)
Takashi Kashiwagi, Richard H. Harris Jr., X H. Zhang, R M. Briber, Srinivasa R. Raghavan, W H. Awad, John R. Shields
The thermal and flammability properties of polyamide 6/clay (2 % and 5 % by mass) nanocomposites were measured to determine their flame retardant performance. The gasification process of the nanocomposite samples at an external radiant flux of 50 kW/m2 in

Fundamental Parameters Line Profile Fitting in Laboratory Diffractometers

February 1, 2004
Author(s)
R W. Cheary, A A. Coelho, James Cline
The fundamental parameters approach to line profile fitting uses physically based models to generate the line profile shapes. Fundamental parameters profile fitting (FPPF) has been used to synthesize and fit data from both parallel beam and divergent beam

High Throughput Measurement of the Elastic Modulus of Polymer Thin Films

February 1, 2004
Author(s)
Christopher M. Stafford, A Chiche, D Julthongpiput, Michael J. Fasolka
Combinatorial and High Throughput (C&HT) methods combine clever experiment design, instrument automation, and computing tools to form a new paradigm for scientific research. Given this premise, the C&HT concept is being adapted to study problems in

High-Frequency Dielectric Relaxation in Trehalose-Glycerol Mixtures

February 1, 2004
Author(s)
O Anopchenko, Jan Obrzut, Bert W. Rust
Broadband dielectric measurements were performed on a series of trehalose-glycerol mixtures in a wide concentration range of glycerol and temperature swept from 220 K to 350 K. Relaxation spectra were obtained directly from the measured dielectric spectra

High-Throughput Adhesion Testing of Combinatorial Libraries With Multi-Lens Arrays

February 1, 2004
Author(s)
Aaron M. Forster, Wenhua Zhang, Christopher Stafford
The NIST Combinatorial Methods Center (NCMC) has adapted the Johnson, Kendall, and Roberts (JKR) test to develop a high-throughput adhesion measurement platform. Traditionally, the JKR test utilizes a single hemispherical lens compressed against (loading)

Hydrosomes and Optical Tweezers: What Can We Do With the World s Smallest Test Tubes?

February 1, 2004
Author(s)
Joseph E. Reiner, Rani B. Kishore, Kristian Helmerson, M K. Gilson
Hydrosomes are micron sized surfactant stabilized water droplets in a fluorocarbon background. Different chemicals can be mixed with the water droplets to form subpicoliter-sized containers. When two hydrosomes come into contact with each other they

Information Depth for Elastic-Peak Electron Spectroscopy

February 1, 2004
Author(s)
Aleksander Jablonski, Cedric J. Powell
We present a formalism for calculating the information depth (ID) for elastic-peak electron spectroscopy (EPES) in which a measurement is made of the intensity of elastically-backscattered electrons for an amorphous or polycrystalline material and a

Intuitive Diffraction Model for Multistaged Optical Systems

February 1, 2004
Author(s)
Eric L. Shirley
A simplified framework is motivated, in which many diffraction effects can be treated, especially in multi-staged optical systems. These include effects of limiting apertures, although this work may be especially suitable when considering diffraction
Displaying 39451 - 39475 of 73960
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