Developing Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal Measurements

Published

August 1, 2004

Author(s)

Jeffrey Jargon, Kuldip Gupta, Donald C. DeGroot

Abstract

In this paper, we introduce nonlinear large-signal scattering parameters, a new type of frequency-domain mapping that related incident and reflected signals. A general form of nonlinear large-signal scattering parameters is presented. It is shownt that they reduce to classic S-parameters in the absence of nonlinearities. Nonlinear large-signal impedance and admittance parameters are also introduced, and equations relating the different representations are derived. We illustrate how nonlinear large-signal scattering parameters can be used as a tool in the design process of a nonlinear circuit, specifically a single-diode 1 GHz frequency-doubler. For the case where a nonlinear model is not readily availabke, a method of extracting nonlinear large-signal scattering parameters is developed using artificial neural network models trained with multiple measurements made by a nonlinear vector network analyzer equipped with two sources. Finally, nonlinear large-signal scattering parameters are compared to another form of nonlinear mapping, known as nonlinear scattering functions. The nonlinear larg-signal scattering parameters are shown to be more general.

Citation

Journal of Research (NIST JRES) -

Volume

109

Issue

4

NIST Pub Series

Journal of Research (NIST JRES)

Pub Type

NIST Pubs

Keywords

frequency-domain, large-signal, measurement, microwave, model, network analyzer, nonlinear, scattering parameter

Citation

Jargon, J. , Gupta, K. and DeGroot, D. (2004), Developing Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal Measurements, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed May 10, 2025)