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Displaying 38851 - 38875 of 73929

Gas Flowmeter Calibrations with the 34 L and 677 L PVTt Standards

June 23, 2004
Author(s)
John D. Wright, Aaron N. Johnson, Michael R. Moldover, Gina M. Kline
This document provides a description of the 34 L and 677 L pressure, volume, temperature, and time (PVTt) primary gas flow standards operated by the National Institute of Standards and Technology (NIST) Fluid Flow Group. These facilities are used to

Phase Relationships in the BaO-Sm 2 O 3 -CuO x System Under 100Pa O 2

June 23, 2004
Author(s)
Winnie K. Wong-Ng, Lawrence P. Cook, J Suh, James A. Kaduk
By applying controlled atmosphere methods to minimize the presence of carbonate, and CO 2 and H 2O contamination, subsolidus phase equilibria of the BaO-Sm 2O 3-CuOx system at pO 2 = 100 Pa (0.1 % O 2 by volume) were successfully determined. Under

Structure and Chemical Characterization of Self-Assembled Mono-Fluoro-Substituted Oligo(phenylene-ethynlyene) Monolayers on Gold

June 22, 2004
Author(s)
Christina Hacker, James D. Batteas, J C. Garno, Manuel Marquez, Curt A. Richter, Lee J. Richter, Roger D. van Zee, Christopher D. Zangmeister
Monolayers of oligo(phenylene-ethynylene) (OPE) molecules have exhibited promise in molecular electronic test structures. This paper discusses films formed from novel molecules within this class, 2-fluoro-4-phenylethynyl-1-[(4-acetylthio)-phenylethynyl

Structure Characterization of Porous Interlevel Dielectric Films

June 21, 2004
Author(s)
Wen-Li Wu, Eric K. Lin, Christopher L. Soles
To extend the dielectric constant of interlevel dielectrics below a value of ~2.6 seen in today s IC chips, porous low-k material has been evaluated as a viable candidate by industries. In this paper, the current status and the future need in metrologies

Molecular Devices Formed by Direct Monolayer Attachment to Silicon

June 17, 2004
Author(s)
Curt A. Richter, Christina Hacker, Lee J. Richter, Eric M. Vogel
We present the results of studies of solution-based attachment of long-chain aliphatic molecules to hydrogen-terminated Si surfaces formed to determine the electrical properties of hybrid silicon-molecular nanoelectronic devices. We have applied an

Software Fault Complexity and Implications for Software Testing

June 16, 2004
Author(s)
D. Richard Kuhn, D Wallace, A M. Gallo
Exhaustive testing of computer software is intractable, but empirical studies of software failures suggest that testing can in some cases be effectively exhaustive. Data reported in this study and others show that software failures in a variety of domains

A Unified Framework for Mobile Device Security

June 15, 2004
Author(s)
Wayne Jansen, Vlad Korolev, Serban I. Gavrila, T Heute, Clement Seveillac
Present-day handheld devices, such as PDAs, are a useful blend of hardware and software oriented toward the mobile workforce. While they provide the capability to review documents, correspond via electronic mail, manage appointments and contacts, etc

TRC Thermodynamic Tables - Nonhydrocarbons, Supplement 91, 2004

June 14, 2004
Author(s)
Michael D. Frenkel
New table for octyl methanoate containing the density for the real fluid at selected temperatures and pressures; New table for propyl ethanoate containing the density for the real fluid at selected temperatures and pressures; New table for bromomethane

Checks of Amplifier Noise-Parameter Measurements

June 11, 2004
Author(s)
James P. Randa, Dave K. Walker
We propose two verification methods for measurements of noise parameters of amplifiers, particularly low-noise amplifiers (LNAs). One method is a direct measurement of the parameter Trev, the noise temperature from the amplifier input, and the comparison

Extended NVNA Bandwidth for Long-Term Memory Measurements

June 11, 2004
Author(s)
Catherine A. Remley, Dominique Schreurs, Dylan F. Williams, John Wood
We present a new technique for measuring the magnitude and phase of intermodulation products outside the measurement bandwidth of our instrumentation. We apply the technique to measurements of long-term memory effects, and realte our measurements to

Non-Linear Large-Signal Scattering Parameters: Theory and Applications

June 11, 2004
Author(s)
Jeffrey Jargon, Kuldip Gupta, Donald C. DeGroot
We introduce nonlinear large-signal scattering parameters, a new type of frequency-domain mapping that relates incident and reflected signals for sparse-tone inputs. We present a general form of nonlinear large-signal scattering parameters and show that
Displaying 38851 - 38875 of 73929
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