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Displaying 38126 - 38150 of 74067

Microfabricated Atomic Clocks at NIST

December 7, 2004
Author(s)
Svenja A. Knappe, P Schwindt, Vladislav Gerginov, V Shah, Leo W. Hollberg, John E. Kitching, Li-Anne Liew, John Moreland
In this paper we present the latest progress in the development, fabrication, and characterization of a microfabricated atomic frequency reference at NIST. With volumes below 10 mm3 the physics packages contain the complete integrated assembly for probing

Models and Confidence Intervals for True Values in Interlaboratory Trials

December 6, 2004
Author(s)
Hariharan K. Iyer, Chih-Ming Wang, T Mathew
We consider the one-way random effects model with unequal sample sizes and heterogeneous variances. Using the method of generalized confidence intervals, we develop a new confidence interval procedure for the mean. Additionally, we investigate two

McMurdie

December 3, 2004
Author(s)
Alan D. Mighell, Gasper J. Piermarini, Winnie K. Wong-Ng
Howard F. McMurdie - known as Mac to his friends oa colleagues--was an exemplar of good living. Blessed with excellent health, a loving family, and many close colleagues, Mac was active and productive to the very end. It is therefore with the deepest

Realization of quantum error correction

December 2, 2004
Author(s)
J Chiaverini, Dietrich G. Leibfried, Tobias Schaetz, Murray D. Barrett, Brad R. Blakestad, Joseph W. Britton, Wayne M. Itano, John D. Jost, Emanuel H. Knill, C. Langer, R Ozeri, David J. Wineland
Scalable quantum computation and communication require error control to protect quantum information against unavoidable noise. Quantum error correction protects quantum information stored in two-level quantum systems (qubits) by rectifying errors with

A Multilens Measurement Platform for High-Throughput Adhesion Measurements

December 1, 2004
Author(s)
Aaron M. Forster, Weiping Zhang, Christopher Stafford
There are few methods available for performing high-throughput adhesion measurements. Current high-throughput methodologies for measuring interfacial adhesion rely on serial or sequential testing of discrete or continuous libraries. Alternatively, we have

A New Design for High-Throughput Peel Tests: Statistical Analysis and Example

December 1, 2004
Author(s)
A Chiche, Weiping Zhang, Christopher Stafford, Alamgir Karim
The peel test is one of the most common techniques to investigate the properties of pressure sensitive adhesives (PSAs). As the demand increases for combinatorial tools to rapidly test material performance, designinig a high-throughput peel test is a

A Perl-Based Framework for Distributed Processing

December 1, 2004
Author(s)
Douglas R. White, John M. Tebbutt
Our results extending Kuhn's fault class hierarchy provide a justification for the focus of fault-based testing strategies on detecting particular faults and ignoring others. We develop a novel analytical technique that allows us to elegantly prove that

A Perl-Based Framework For Distributed Processing

December 1, 2004
Author(s)
Douglas R. White, John M. Tebbutt
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and publishes file profiles computed from this software (such as MD5 and SHA-1 hashes) as a Reference

A Simple Approach to One-Laser, Broadband CARS Microscopy

December 1, 2004
Author(s)
Marcus T. Cicerone, T W. Kee
Coherent anti-Stokes Raman scattering (CARS) microscopy is emerging as a powerful method for imaging materials and biological systems, partly because of its non-invasiveness and selective chemical sensitivity. However, its full potential for species

Advances in Radiated EMC Measurement Techniques

December 1, 2004
Author(s)
Perry F. Wilson
Recent research on radiated electromagnetic compatibility measurement techniques is reviewed. The focus is on both widely used methods (open area test site, anechoic chamber, TEM devices) and emerging methods (reverberation chamber, near-field techniques)

Analysis of Ventilation Data from the U.S. Environmental Protection Agency Building Assessment Survey and Evaluation (BASE) Study. (NIST IR 7145) [SUPERSEDED BY NIST IR 7145-R, Published 3/10/2009]

December 1, 2004
Author(s)
Andrew K. Persily, J Gorfain
The U.S. Environmental Protection Agency (EPA) Building Assessment Survey and Evaluation (BASE) study included a range of measurements in 100 randomly selected U.S. office buildings for the purpose of characterizing the existing building stock with respect

Array Ordering in Dendritic Crystals and the Influence on Crystal Perfection

December 1, 2004
Author(s)
R E. Napolitano, David R. Black
In the work reported here, several important issues regarding the role of the evolving dendritic structure in the generation of crystal defects are investigated. Industrially produced single-crystal castings are examined, and the dendritic arrays are
Displaying 38126 - 38150 of 74067
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