Elastic Instability of Multilayer Films Coated on Substrates
Shu Guo, Martin Y. Chiang, Christopher M. Stafford
Mechanical properties of ultra-thin (submicrometer) films coated on a substrate are paramount in many applications. One question arises as to whether the physical and mechanical properties of supported thin films in applications can be significantly different from the properties of chemically identical bulk materials. There have been many methods developed to measure these properties of thin films for the purpose of understanding the relation between the microstructure and behavior of material in the bulk and material in thin films coated on a substrate.The basic concept among them is that these properties can be deduced from the response of a film/substrate system perturbed either mechanically, thermally, acoustically, or optically. In some specialty or common applications, multilayer material system has been developed to meet the increasingly demanding cost and performance requirements. Therefore, we present here a theoretical analysis for the structural stability of a multilayer system on an elastic medium. Ultimately, rather than a single layer system reported in the literature, this stability analysis could facilitate the development of a measurement technique for deducing the mechanical properties of each constituent layer in a multilayer system. Also, the finite element analysis (FEA) has been performed on the multilayer system to clarify the assumptions used and validate the results in the theoretical analysis.
, Chiang, M.
and Stafford, C.
Elastic Instability of Multilayer Films Coated on Substrates, Proceedings| 28th Annual Meeting, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852474
(Accessed March 3, 2024)