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Emittance standards for improved radiation thermometry during thermal processing of silicon materials, ed. by D. Zvizdic

Published

Author(s)

Benjamin K. Tsai, D P. DeWitt, E A. Early, Leonard M. Hanssen, Sergey Mekhontsev, Matthias Rink, K G. Kreider, B J. Lee, Z M. Zhang
Proceedings Title
TEMPMEKO 2004
Conference Dates
June 22-25, 2004
Conference Location
Zagreb, IL
Conference Title
Proc. TEMPMEKO 2004

Citation

Tsai, B. , DeWitt, D. , Early, E. , Hanssen, L. , Mekhontsev, S. , Rink, M. , Kreider, K. , Lee, B. and Zhang, Z. (2005), Emittance standards for improved radiation thermometry during thermal processing of silicon materials, ed. by D. Zvizdic, TEMPMEKO 2004 , Zagreb, IL (Accessed August 12, 2022)
Created January 1, 2005, Updated February 17, 2017