Tsai, B.
, DeWitt, D.
, Early, E.
, Hanssen, L.
, Mekhontsev, S.
, Rink, M.
, Kreider, K.
, Lee, B.
and Zhang, Z.
(2005),
Emittance standards for improved radiation thermometry during thermal processing of silicon materials, ed. by D. Zvizdic, TEMPMEKO 2004 , Zagreb, IL
(Accessed September 15, 2024)
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Emittance standards for improved radiation thermometry during thermal processing of silicon materials, ed. by D. Zvizdic
Published
Author(s)
, , , , , , K G. Kreider, B J. Lee, Z M. Zhang
Proceedings Title
TEMPMEKO 2004
Conference Dates
June 22-25, 2004
Conference Location
Zagreb, IL
Conference Title
Proc. TEMPMEKO 2004
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 2005, Updated February 17, 2017