@conference{124336,
  author = {Benjamin Tsai and D DeWitt and E Early and Leonard Hanssen and Sergey Mekhontsev and Matthias Rink and K Kreider and B Lee and Z Zhang},
  title = {Emittance standards for improved radiation thermometry during thermal processing of silicon materials, ed. by D. Zvizdic},
  year = {2005},
  month = {2005-01-01},
  publisher = {TEMPMEKO 2004 , Zagreb, IL},
  language = {en},
}