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Displaying 37876 - 37900 of 74120

Optoelectronics Division Programs, Activities, and Accomplishments

January 1, 2005
Author(s)
Kent B. Rochford
The NIST Optoelectronics Division provides measurement technology, standards, and traceability for the optoelectronics industry. This document describes the programs, activities, and accomplishments of the Division during the the 2004 fiscal year. It is

Panoramic, Ultrawideband, Diagnostic Imaging of Test Volumes

January 1, 2005
Author(s)
David R. Novotny, Robert T. Johnk, Chriss A. Grosvenor, Seturnino Canales
This paper presents developing methodologies to assess the quality and range of use (in frequency, test volume size, and test type) of EMC test facilities. Previous efforts [1-2] have focused on transmission tests that represented typical antenna and test

Passive fire protection:

January 1, 2005
Author(s)
Nicholas J Carino, Monica A Starnes, John L Gross, Jiann C Yang, Scott R Kukuck, Kuldeep R Prassad, Richard W Bokowski

Photomask Metrology, Photomask Fabrication Technology

January 1, 2005
Author(s)
Richard M. Silver, Andras Vladar
In this paper we will focus on the different metrology techniques used to measure features on photomasks. In view of the above discussion, we will focus on the importance of accurately measuring features and developing traceability. The metrology
Displaying 37876 - 37900 of 74120
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