Han, J.
, Koo, S.
, Vogel, E.
, Gusev, E.
, D'Emic, C.
, Richter, C.
and Suehle, J.
(2005),
Reverse Short Channel Effects in High-k Gated nMOSFETs, Microelectronics Reliability, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32101
(Accessed October 7, 2024)
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Reverse Short Channel Effects in High-k Gated nMOSFETs
Published
Author(s)
, , , Evgeni Gusev, C. D'Emic, ,
Citation
Microelectronics Reliability
Volume
45
Pub Type
Journals
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created February 27, 2005, Updated October 12, 2021