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Reverse Short Channel Effects in High-k Gated nMOSFETs



Jin-Ping Han, Sang-Mo Koo, Eric M. Vogel, Evgeni Gusev, C. D'Emic, Curt A. Richter, John S. Suehle
Microelectronics Reliability


Han, J. , Koo, S. , Vogel, E. , Gusev, E. , D'Emic, C. , Richter, C. and Suehle, J. (2005), Reverse Short Channel Effects in High-k Gated nMOSFETs, Microelectronics Reliability, [online], (Accessed December 3, 2023)
Created February 27, 2005, Updated October 12, 2021