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Reverse Short Channel Effects in High-k Gated nMOSFETs

Published

Author(s)

Jin-Ping Han, Sang-Mo Koo, Eric M. Vogel, Evgeni Gusev, C. D'Emic, Curt A. Richter, John S. Suehle
Citation
Microelectronics Reliability
Volume
45

Citation

Han, J. , Koo, S. , Vogel, E. , Gusev, E. , D'Emic, C. , Richter, C. and Suehle, J. (2005), Reverse Short Channel Effects in High-k Gated nMOSFETs, Microelectronics Reliability, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32101 (Accessed June 24, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created February 27, 2005, Updated October 12, 2021