TY  - JOUR
AU  - Jin-Ping Han
AU  - Sang-Mo Koo
AU  - Eric Vogel
AU  - Evgeni Gusev
AU  - C. D'Emic
AU  - Curt Richter
AU  - John Suehle
C2  - Microelectronics Reliability
DA  - 2005-02-28 00:02:00
LA  - en
M1  - 45
PB  - Microelectronics Reliability
PY  - 2005
TI  - Reverse Short Channel Effects in High-k Gated nMOSFETs
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32101
ER  -