@article{759061,
  author = {Jin-Ping Han and Sang-Mo Koo and Eric Vogel and Evgeni Gusev and C. D'Emic and Curt Richter and John Suehle},
  title = {Reverse Short Channel Effects in High-k Gated nMOSFETs},
  year = {2005},
  number = {45},
  month = {2005-02-28 00:02:00},
  publisher = {Microelectronics Reliability},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32101},
  language = {en},
}