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NIST Authors in Bold

Displaying 376 - 400 of 5216

Electro-optically derived millimeter-wave sources with phase and amplitude control

October 12, 2021
Author(s)
Bryan Bosworth, Nick Jungwirth, Kassi Smith, Jerome Cheron, Franklyn Quinlan, Ari Feldman, Dylan Williams, Nate Orloff, Chris Long
Integrated circuits are building blocks in millimeter-wave handsets and base stations, requiring nonlinear characterization to optimize performance and energy efficiency. Today's sources use digital-to-analog converters to synthesize arbitrary electrical

MULTI-COLLECTOR CONFIGURATION CONSIDERATIONS AND SUBSTRATE RELATIVE SENSITIVITY FACTOR EFFECTS FOR AGE-DATING MEASUREMENTS OF PARTICLES BY LARGE GEOMETRY SECONDARY ION MASS SPECTROMETRY

October 1, 2021
Author(s)
Todd Williamson, David S. Simons, John D. Fassett
Chronometry (a.k.a age-dating, AD) of materials by bulk mass spectrometric methods is a well-established technique based on analysis protocols that have been used in geological fields and by the non-proliferation communities for many years. Recently, it

X-ray Computed Tomography Instrument Performance Evaluation, Part III: Sensitivity to Detector Geometry and Rotation Stage Errors at Different Magnifications

September 29, 2021
Author(s)
Prashanth Jaganmohan, Bala Muralikrishnan, Meghan Shilling, Ed Morse
With steadily increasing use in dimensional metrology applications, especially for delicate parts and those with complex internal features, X-ray computed tomography (XCT) has transitioned from a medical imaging tool to an inspection tool in industrial

Quantum-Based Photonic Sensors for Pressure, Vacuum, and Temperature Measurements: A Vison of the Future with NIST on a Chip

September 17, 2021
Author(s)
Jay H. Hendricks, Zeeshan Ahmed, Daniel Barker, Kevin O. Douglass, Stephen Eckel, James A. Fedchak, Nikolai Klimov, Jacob Edmond Ricker, Julia Scherschligt
The NIST on a Chip (NOAC) program's central idea is the idea that measurement technology can be developed to enable metrology to be performed "outside the National Metrology Institute" by the crea-tion of deployed and often miniaturized standards. These

Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory

September 16, 2021
Author(s)
Carlos R. Beauchamp, Johanna Camara, Jennifer Carney, Steven J. Choquette, Kenneth D. Cole, Paul C. DeRose, David L. Duewer, Michael Epstein, Margaret Kline, Katrice Lippa, Enrico Lucon, John L. Molloy, Michael Nelson, Karen W. Phinney, Maria Polakoski, Antonio Possolo, Lane C. Sander, John E. Schiel, Katherine E. Sharpless, Michael R. Winchester, Donald Windover
The National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards, was established by the U.S. Congress in 1901 and charged with establishing a measurement foundation to facilitate U.S. and international commerce. NIST

Perspective: Reproducible coherence characterization of superconducting quantum devices

September 6, 2021
Author(s)
Corey Rae McRae, Joshua Combes, Gregory Stiel, Haozhi Wang, Sheng Xiang Lin, David P. Pappas, Josh Mutus
As the field of superconducting quantum computing approaches maturity, optimization of single-device performance is proving to be a promising avenue toward large-scale quantum computers. However, this optimization is possible only if performance metrics

An open-access future for Journal of Synchrotron Radiation - an Editorial from the Main Editors and IUCr Journals Editor-in-Chief

September 1, 2021
Author(s)
Kristina Kvashnina, Yoshiyuki Amemiya, Dibyendu Bhattacharyya, Ingolf Lindau, Andrew J. Allen
This is an Editorial for the Journal of Synchrotron Radiation (JSR) to inform all readers, authors and supporters about the coming transition of the journal to become fully open access. All papers submitted to JSR after 1 October 2021, will be for open
Displaying 376 - 400 of 5216
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