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LTE Handset Emissions: Radiation Pattern Measurements Final Test Report

Published

Author(s)

Robert D. Horansky, Jason B. Coder, John M. Ladbury

Abstract

The Defense Information Systems Agency (DISA) Defense Spectrum Organization (DSO) throughthe Spectrum Sharing Test and Development (SSTD) program proposed a National AdvancedSpectrum and Communications Test Network (NASCTN) measurement campaign to quantitativelycharacterize Long Term Evolution (LTE) uplink (UL) emissions generated by User Equipment(UE) in the 1755 MHz to 1780 MHz band with the intent to develop realistic models of UE emis-sions. These models will be used for assessing interference to Department of Defense (DoD)systems that, for a time, will remain in the 1755 MHz to 1780 MHz band.The test executed by NASCTN is one of a series of potential measurements designed to better un- derstand the emissions of commercial LTE UEs, both individually and in aggregate. This projectperformed a series of controlled laboratory measurements over a variety of LTE network, environ-mental, and use case conditions which were designed to better understand UE emissions and whatparameter(s) impact the emissions. In contrast to field-based measurements with limited knowl-edge of network settings, laboratory measurements allowed control and manipulation of all aspectsof the network and environment giving the ability to test the sensitivity of each parameter of in-terest. The work includes an analysis of the assumptions, measurement uncertainties, and theireffects on the uncertainty of the estimated parameters.In order to support the NASCTN project, an understanding of the three dimensional emissionsof typical LTE UEs was needed. Current models use a simplistic and static representation of UEantenna patterns that does not capture true effects nor any variation between manufacturers andmodels. The UE pattern measurements presented in this report allow analysis of the impact oflocation of the UE to emission strength and differences between a sampling of UEs. This paperprovides the details and results of the UE pattern measurement activity
Citation
Technical Note (NIST TN) - 2056
Report Number
2056

Keywords

LTE, antenna pattern, NASCTN

Citation

Horansky, R. , Coder, J. and Ladbury, J. (2019), LTE Handset Emissions: Radiation Pattern Measurements Final Test Report, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.TN.2056 (Accessed July 24, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 16, 2019, Updated August 20, 2019