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Displaying 35026 - 35050 of 74171

Fire Dynamics Simulator (Version 4) - Technical Reference Guide

March 1, 2006
Author(s)
Kevin B. McGrattan
Fire Dynamics Simulator (FDS) is a computational fluid dynamics (CFD) model of fire-driven fluid flow. The software described in this document solves numerically a form of the Navier-Stokes equations appropriate for low-speed, thermally-driven flow with an

Fundamentals of the Reaction-Diffusion Process in Model EUV Photoresists

March 1, 2006
Author(s)
Kristopher Lavery, George Thompson, Hai Deng, D S. Fryer, Kwang-Woo Choi, B D. Vogt, Vivek Prabhu, Eric K. Lin, Wen-Li Wu, Sushil K. Satija, Michael Leeson, Heidi B. Cao
More demanding requirements are being made of photoresist materials for fabrication of nanostructures as the feature critical dimensions (CD) decrease. For EUV resists, control of line width roughness (LWR) and high resist sensitivity are key requirements

High-accuracy determination of epitaxial AlGaAs composition with inductively coupled plasma optical emission spectroscopy

March 1, 2006
Author(s)
Kristine A. Bertness, C. M. Wang, Marc L. Salit, Gregory C. Turk, Therese A. Butler, Albert J. Paul, Larry Robins
Inductively coupled plasma optical emission spectroscopy is shown to confirm a recent correlation between photoluminescence (PL) peak energy for AlGaAs epitaxial films and the Al mole fraction x of those films. These two methods also agree within their

Koehler Illumination for High-Resolution Optical Metrology

March 1, 2006
Author(s)
Martin Y. Sohn, Bryan M. Barnes, Lowell P. Howard, Richard M. Silver, Ravikiran Attota, Michael T. Stocker
Accurate preparation of illumination is critical for high-resolution optical metrology applications such as line width and overlay measurements. To improve the detailed evaluation and alignment of the illumination optics, we have separated Koehler

Magnetic Field-Induced Spectroscopy of Strongly Forbidden Optical Transitions

March 1, 2006
Author(s)
Alexey Taychenachev, V Yudin, Christopher W. Oates, C Hoyt, Zeb Barber, Leo W. Hollberg
We propse a method that uses a static magnetic field to enalbe direct optical excitation of forbidden electric dipole transitions that are otherwise prohibitively weak. The method is based on mxing of atomic states by a static magnetic field. The methid

Measurement of Impulse Spectrum Amplitude for Use in EMI Susceptibility Tests

March 1, 2006
Author(s)
Nicholas Paulter, Donald R. Larson
A system for measuring the impulse spectrum amplitude of the output of impulse generators and the response of receivers is described. The calibration procedures used in this measurement system were recently modified, which resulted in a reduction in the

Minimum Security Requirements for Federal Information and Information Systems

March 1, 2006
Author(s)
National Institute of Standards and Technology (NIST), Ronald S. Ross, Stuart W. Katzke, L A. Johnson
FIPS 200 is the second standard that was specified by the Federal Information Security Management Act (FISMA). It is an integral part of the risk management framework that the National Institute of Standards and Technology (NIST) has developed to assist

Oxidative Stress and DNA Damage-DNA Repair System in Vascular Smooth Muscle Cells in Artery and Vein Grafts

March 1, 2006
Author(s)
S. H. McLaren, D. Gao, L. Chen, J. R. Eshleman, V. Dawson, M. A. Trush, V. Bohr, M. Dizdaroglu, G. M. Williams, C. Wei
Graft failure in coronary artery bypass grafts (CABGs) utilizing the saphenous vein is significantly higher than in those utilizing the internal mammary artery (IMA) or the radial artery (RA). While a number of studies have described this phenomenon

Perceptual Study of the Impact of Varying Frame Rate on Motion Imagery Interpretability

March 1, 2006
Author(s)
Charles D. Fenimore, J Irvine, D Cannon, John W. Roberts, A Aviles, S Israel, Michelle Brennan, L Simon, J Miller, Donna Haverkamp, P F. Tighe, Michael Gross
The development of a motion imagery (MI) quality scale, akin to the National Image Interpretibility Rating Scale (NIIRS) for still imagery, would have great value to designers and users of surveillance and other MI systems. A multi-phase study has adopted

Precision Measurement Method for Cryogenic Amplifier Noise Temperatures Below 5 K

March 1, 2006
Author(s)
James P. Randa, Eyal Gerecht, Dazhen Gu, Robert L. Billinger
We report precision measurements of the effective input noise temperature of a cryogenic (liquid helium temperature) MMIC amplifier at the amplifier reference planes within the cryostat. A method is given for characterizing and removing the effect of the

Progress on Implementation of a CD-AFM Based Reference Measurement System

March 1, 2006
Author(s)
Ndubuisi G. Orji, Angela Martinez, Ronald G. Dixson, J Allgair
The National Institute of Standards and Technology (NIST) and SEMATECH are working to address traceability issues in semiconductor dimensional metrology. In semiconductor manufacturing, many of the measurements made in the fab are not traceable to the SI

Resonance-free Low-pass Filters for the ac Josephson Voltage Standard

March 1, 2006
Author(s)
Michio Watanabe, Paul Dresselhaus, Samuel Benz
We have designed and characterized superconducting integrated circuits for the ac Josephson voltage standard that demonstrate significantly improved performance. The typical circuit consists of an array of superconductor-normal metal-superconductor

Sampling-Oscilloscope Measurement of a Microwave Mixer With Single-Digit Phase Accuracy

March 1, 2006
Author(s)
Dylan F. Williams, Hassen Khenissi, Fabien Ndagijimana, Catherine A. Remley, Joel Dunsmore, Paul D. Hale, Jack Wang, Tracy S. Clement
We describe a straightforward method of separately characterizing up-conversion and down-conversion in microwave mixers with a sampling oscilloscope. The method mismatch-corrects the results, determines both magnitude and phase, and uses a novel time-base

Symmetry, Equivalence and Molecular Self-Organization

March 1, 2006
Author(s)
K Van Workum, Jack F. Douglas
Abstract: Self-organization is central to the formation of numerous biological structures and the emulation of this process through the creation of synthetic counterparts offers great promise for nanofabrication. Our approach to understanding the

Temperature Measurements of Microhotplates Using Fluorescence Thermometry

March 1, 2006
Author(s)
Christopher W. Meyer, Douglas C. Meier, Christopher B. Montgomery, Stephen Semancik
A fluorescence microscope has been constructed for measuring surface temperatures of microhotplate platforms. The microscope measures temperature-dependent fluorescence lifetimes of a film of the phosphor Mg4(F)GeO6:Mn which is deposited on the
Displaying 35026 - 35050 of 74171
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