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NIST Authors in Bold

Displaying 31776 - 31800 of 74165

Experimental Line Parameters of the Oxygen A-Band Using Frequency-Stabilized Cavity Ring-Down Spectroscopy

January 1, 2008

Author(s)

D J. Robichaud, Joseph T. Hodges, Linda R. Brown, D Lisak, Piotr Maslowski, Charles E. Miller

Line intensities, self- and air-broadened linewidths, pressure-induced shifts, and collisional narrowing coefficients were measured from 18

Extending the notion of quality from physical metrology to information and sustainability:

January 1, 2008

Author(s)

Gaurav Ameta, Sudarsan Rachuri, Xenia Fiorentini, Mahesh Mani, Steven J Fenves, Kevin W Lyons, Ram D Sriram

Fast automatic registration of range images from 3D imaging systems using sphere targets

January 1, 2008

Author(s)

Marek Franaszek, Geraldine S. Cheok, Christoph J. Witzgall

3D imaging systems are line of sight instruments and multiple scans from different locations are often needed to get a good representation of an entire scene. Therefore, registration of different datasets to a common coordinate system is required

Fatigue Damage in Ceramic Coatings From Cyclic Contact :Loading with Tangential Component

January 1, 2008

Author(s)

Yuyan Zhang, J.-W Kim, J H. Kim, Brian R. Lawn

Forensic filtering of cell phone protocols:

January 1, 2008

Author(s)

Aurelien Delaitre, Wayne Jansen

Guide for assessing the security controls in federal information systems and organizations ::building effective security assessment plans

January 1, 2008

Author(s)

R Ross, L A Johnson, S Katzke, P Toth, G Stoneburner, G Rogers

Guide for the use of the International System of Units (SI):

January 1, 2008

Author(s)

E Ambler Thompson, E Ambler Thompson, Barry N Taylor

Guide to bluetooth security:

January 1, 2008

Author(s)

K A Scarfone, J Padgette

Guide to general server security:

January 1, 2008

Author(s)

K A Scarfone, W Jansen, M Tracy

Guide to securing legacy IEEE 802.11 wireless networks:

January 1, 2008

Author(s)

K A Scarfone, D Dicoi, M Sexton, C Tibbs

Guide to securing Microsoft Windows XP Systems for IT Professionals ::a NIST security configuration checklist

January 1, 2008

Author(s)

K A Scarfone, M P Souppaya, P M Johnson

Guide to SSL VPNs:

January 1, 2008

Author(s)

S E Frankel, P Hoffman, A D Orebaugh, R Park

Guidelines for accepting 2D building plans:

January 1, 2008

Author(s)

Geraldine S Cheok, James Filliben, Alan M Lytle

Guidelines for planning and development of software for buildings and building systems:

January 1, 2008

Author(s)

Priya D Lavappa

Guidelines for using color in voting systems:

January 1, 2008

Author(s)

Maureen Stone, Sharon J Laskowski, Svetlana Z Lowry

Guidelines on active content and mobile code:

January 1, 2008

Author(s)

W Jansen, T Winograd, K A Scarfone

Handbook of frequency stability analysis:

January 1, 2008

Author(s)

W J Riley, W J Riley

High power laser calibrations at NIST:

January 1, 2008

Author(s)

Xiaoyu Li, Joshua Hadler, Christopher Cromer, John Lehman, Marla Dowell

High Temperature Electrical Resistance of substrate-supported Single Walled Carbon Nanotubes

January 1, 2008

Author(s)

Richard E. Cavicchi, C Avedisian, Paul M. McEuen, Xinjian Zhou, Wilbur S. Hurst, Joseph T. Hodges

We report the electrical characteristics of two substrate-supported metallic single walled carbon nanotubes (SWNT) at temperatures up to 573 K over a range of bias voltages for zero gate voltage in air under atmospheric pressure. At low voltages or high

High-Precision Pressure Shifting Measurement Technique Using Frequency-Stabilized Cavity Ring-Down Spectroscopy

January 1, 2008

Author(s)

D J. Robichaud, Joseph T. Hodges, D Lisak, Charles E. Miller, Mitchio Okumura

We describe a high-precision method for measuring pressure shifting of absorption lines. The technique involves the acquisition of high-resolution spectra using a cavity ring-down spectrometer whose length is continuously locked to a frequency-stabilized

Holmium Oxide Glass Wavelengths Standards

January 1, 2008

Author(s)

David W. Allen

Holmium oxide glass has been used as a wavelength standard for over four decades. These standards have shown very little variation from batch to batch and from one manufacturer to another. NIST has certified and recertified holmium oxide glass samples for

HVACSIM user's gude update:

January 1, 2008

Author(s)

Cheol Park

Hydrometer Calibration by Hydrostatic Weighing With Automated Liquid Surface Positioning

January 1, 2008

Author(s)

Jesus J. Aguilera, John D. Wright, Vern E. Bean

We describe an automated apparatus for the calibration of hydrometers by hydrostatic weighing (Cuckow s method). The apparatus uses a laser light sheet and a laser power meter to position the liquid surface at the hydrometer scale mark to be calibrated. We

Impact of a residential sprinkler on the heat release rate of a Christmas tree fire:

January 1, 2008

Author(s)

Daniel Madrzykowski

In Situ Gas Phase Diagnostics for Hafnium Oxide Atomic Layer Deposition

January 1, 2008

Author(s)

James E. Maslar, Wilbur S. Hurst, Donald R. Burgess Jr., William A. Kimes, Nhan V. Nguyen, Elizabeth F. Moore, Joseph T. Hodges

Atomic layer deposition (ALD) is an important method for depositing the nanometer-scale, conformal high  dielectric layers required for many nanoelectronics applications. In situ monitoring of ALD processes has the potential to yield insights that will

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