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Extending the notion of quality from physical metrology to information and sustainability:

Published

Author(s)

Gaurav Ameta, Sudarsan Rachuri, Xenia Fiorentini, Mahesh Mani, Steven J Fenves, Kevin W Lyons, Ram D Sriram
Citation
- NIST IR 7517
Report Number
NIST IR 7517

Citation

Ameta, G. , Rachuri, S. , Fiorentini, X. , Mani, M. , Fenves, S. , Lyons, K. and Sriram, R. (2008), Extending the notion of quality from physical metrology to information and sustainability:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.7517 (Accessed October 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 2008, Updated May 20, 2023