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Search Publications

NIST Authors in Bold

Displaying 31201 - 31225 of 74260

Laser noise cancellation in single-cell CPT clocks

July 1, 2008
Author(s)
Vladislav Gerginov, Svenja A. Knappe, V Shah, Leo W. Hollberg, John E. Kitching
We demonstrate a new technique for the suppression of noise associated with the laser source in atomic clocks based on coherent population trapping. The technique uses differential detection of the transmission of linearly- and circularly-polarized beams

Methods for Quantifying and Characterizing Errors in Pixel-Based 3D Rendering

July 1, 2008
Author(s)
John G. Hagedorn, Judith E. Terrill, Adele P. Peskin, James J. Filliben
We present methods for measuring errors in the rendering of three-dimensional points, line segments, and polygons in pixel-based computer graphics systems. We present error metrics for each of these three cases. These methods are applied to rendering with

Nanoscopic Porous Sensors

July 1, 2008
Author(s)
John J. Kasianowicz, Joseph W. Robertson, Elaine Chan, Joseph E. Reiner, Vincent M. Stanford
There are thousands of different nanometer-scale pores in biology,many of which act as sensors for specific chemical agents. Recent work suggests that protein and solid-state nanopores have many potential uses in a wide variety of analytical applications

Performance Evaluation of Phasor Measurement Systems

July 1, 2008
Author(s)
Zhenyu Huang, Bogdan Kasztenny, Vahid Madani, Ken Martin, Sakis Meliopoulos, Damir Novosel, Gerard N. Stenbakken
Abstract--After two decades of phasor network deployment, phasor measurements are now available at many major substations and power plants. The North American SynchroPhasor Initiative (NASPI), supported by the US Department of Energy and the North American

Semiconductor Microelectronics and Nanoelectronics Programs

July 1, 2008
Author(s)
Stephen Knight, Joaquin (. Martinez, Yaw S. Obeng, Michele L. Buckley
The microelectronics industry supplies vital components to the electronics industry and to the U.S. economy, enabling rapid improvements in productivity and in new high technology growth industries such as electronic commerce and biotechnology. The

SRM Spotlight July 2008

July 1, 2008
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST Standard Reference Materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains

Stiffening of the Extrapulmonary Arteries in Chronic Hypoxic Pulmonary Hypertension

July 1, 2008
Author(s)
Elizabeth S. Drexler, J. E. Bischoff, Christopher N. McCowan, Andrew Slifka, Timothy P. Quinn, R Shandas, Dunbar Ivy, K. R. Stenmark
It is increasingly appreciated that changes in the compliance properties of large blood vessels are critical determinants of ventricular afterload and ultimately dysfunction. Little is known of the mechanical properties of large vessels in the setting of

Structural and Electronic Properties of Bilayer Epitaxial Graphene

July 1, 2008
Author(s)
Gregory M. Rutter, Jason Crain, N Guisinger, Phillip N. First, Joseph A. Stroscio
Scanning tunneling microscopy (STM) and spectroscopy (STS) is used to study the structural and electronic properties of bilayer epitaxial graphene on SiC(0001). Topographic images reveal that graphene conforms to the SiC interface roughness and is observed

Sustaining Engineering Informatics: Toward Methods and Metrics for Digital Curation

July 1, 2008
Author(s)
Joshua Lubell, Sudarsan Rachuri, Eswaran Subrahmanian, Mahesh Mani
Ensuring the long-term usability of engineering informatics (EI) artifacts is a challenge, particularly for products with longer life cycles than the computing hardware and software used for their design and manufacture. Addressing this challenge requires

The Atomic-Scale Investigation of Graphene Formation on 6H-SiC(0001)

July 1, 2008
Author(s)
N Guisinger, Gregory M. Rutter, Jason Crain, Christian Heiliger, P First, Joseph A. Stroscio
The growth of graphene on the silicon terminated face of 6H-SiC(0001) was investigated by scanning tunneling microscopy (STM) measurements. The initial stages of ultra high vacuum (UHV) graphitization resulted in the growth of individual graphene sheets on

The Escherichia coli YdcF binds S-adenosyl-L-methionine and adopts an alpha/beta fold characteristic of nucleotide-utilizing enzymes

July 1, 2008
Author(s)
Kinlin L. Chao, Kap Lim, C Lehmann, V Doseeva, A J. Howard, Frederick P. Schwarz, Osnat Herzberg
The crystal structure of YdcF at a resolution of 0.18 nm reveals a fold of the adenine nucleotide α hydrolase-like family. Following the structural clues, a nucleotide binding screen was carried out employing isothermal titration calorimetry. The following

A Framework for Measuring the Vulnerability of Hosts

June 30, 2008
Author(s)
Karen A. Scarfone, Timothy Grance
This paper proposes a framework for measuring the vulnerability of individual hosts based on current and historical operational data for vulnerabilities and attacks. Previous approaches have not been scalable because they relied on complex manually

Applying Automated Metrics to Speech Translation Dialogs

June 30, 2008
Author(s)
Sherri Condon, Jon Phillips, Christy Doran, John Aberdeen, Dan Parvaz, Beatrice Oshika, Gregory A. Sanders, Craig I. Schlenoff
Over the past five years, the Defense Advanced Research Projects Agency (DARPA) has funded development of speech translation systems for tactical applications. A key component of the research program has been extensive system evaluation, with dual

Chapter 2Combustion Products and Their Effects on Life Safety

June 30, 2008
Author(s)
Richard G. Gann, Nelson P. Bryner
All combustibles produce heat and smoke that, in sufficiently high concentration, may be hazardous to life safety. Incapacitation can result from exposure to the asphyxiant gases, irritant gases, and heat. Irritant gases and visible smoke can reduce a

Systematic-Error Signals in the AC Josephson Voltage Standard: Measurement and Reduction

June 30, 2008
Author(s)
Regis Landim, Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs
We investigate the dominant frequency-dependent systematic error signals (SES) in the ac Josephson voltage standard. We describe our error measurement technique and a number of methods to reduce the errors. Most importantly we found that a small change in
Displaying 31201 - 31225 of 74260
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