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NIST Authors in Bold

Displaying 301 - 325 of 762

Colored Noise and Regularization Parameter Selection for Waveform Metrology

July 8, 2014
Author(s)
Andrew M. Dienstfrey, Paul D. Hale
We study six regularization parameter selection algorithms applied to deconvolution problems relevant for characterization of high-speed communication measurement systems. In particular we investigate the performance of these selectors in the presence of

Inter-BAN Interference Mitigation: A Correlated Equilibrium Perspective

June 13, 2014
Author(s)
Vladimir Marbukh, Kamran Sayrafian, Martina Barbi, Mehdi Alasti
A Body Area Network (BAN) is a wireless network of wearable or implantable computing devices. A BAN typically consists of several miniaturized radio-enabled body sensor/actuator that communicate with a single coordinator. Medical applications usually

A Prescription for THz Transistor Characterization

April 4, 2014
Author(s)
Dylan F. Williams
Advances in microwave wafer probes and vector network analyzers have opened up a whole new world of discovery in microwave metrology, making possible accurate on-wafer measurements in printed transmission lines at microwave, millimeter-wave, sub-millimeter

Calibrations for Millimeter-Wave Silicon Transistor Characterization

March 1, 2014
Author(s)
Dylan F. Williams, Phillip Corson, Sharma Jahnavi, Krishnaswamy Harish, Wei Tai, George Zacharias, Ricketts David, Watson Paul, Dacquay Eric, Voinigescu Sorin
This paper compares on-wafer thru-reflect-line (TRL) and off-wafer short-open-load-thru (SOLT) and line-reflect-reflect-match (LRRM) vector-network-analyzer probe-tip calibrations for amplifier characterization and parasitic-extraction calibrations for

A four-pixel single-photon pulse-position array fabricated from WSi superconducting nanowire single- photon detectors

February 3, 2014
Author(s)
Varun B. Verma, Robert D. Horansky, Francesco Marsili, Jeffrey Stern, Matthew Shaw, Adriana E. Lita, Richard P. Mirin, Sae Woo Nam
We demonstrate a scalable readout scheme for an infrared single-photon pulse-position camera consisting of WSi superconducting nanowire single-photon detectors. For an N × N array, only 2 × N wires are required to obtain the position of a detection event

Analysis for Dynamic Metrology

January 30, 2014
Author(s)
Andrew M. Dienstfrey, Paul D. Hale
Diverse measurement contexts require estimates of time varying quantities. Ideally the measurement device responds to signal variations significantly more rapidly than the modulation of the signal itself. If so, then well-developed techniques may be used

Greedy Backpressure Routing for Smart Grid Sensor Networks

January 13, 2014
Author(s)
Hamid Gharavi
In this paper, a greedy backpressure routing protocol is proposed for multigate mesh networks. This protocol evaluates the greedy backpressure metric (GBM) value of mesh points and routes packets in the direction of the steepest gradient. The GBM value is

10 TOhm and 100 TOhm High Resistance Measurements at NIST

September 25, 2013
Author(s)
Dean G. Jarrett, Marlin E. Kraft
The measurement techniques, standards, and bridges used to calibrate standard resistors in the 10 TΩ to 100TΩ range at NIST are described. Standard resistors, guarded Hamon transfer standard, and 10:1 and 100:1 bridge ratios, were used to provide multiple

On the Link Between Insertion Loss and Lower Bound of Efficiency

August 9, 2013
Author(s)
Levon Barsikyan, Jason Coder, Mark Golkowski, John M. Ladbury
We investigate the effect of chamber loss on the recently developed 2-port antenna model and the associated method of determining antenna efficiency. The loss in the reverberation chamber was controlled using microwave absorbing foam creating four

Hybrid quantum-well system for wavelength-channel selection

June 28, 2013
Author(s)
Lu Deng, Edward W. Hagley, Chengjie Zhu
We consider a hybrid quantum-well structure consisting of regions whose properties alternate between active Raman gain and electromagnetically induced transparency. We present both analytical and numerical results that indicate a large light beam defection

Traceability for Aerosol Electrometer in the fA Range

June 1, 2013
Author(s)
Dean G. Jarrett, Miles Owen
Described here are the configurations and procedures used to provide traceability to electrical standards for an aerosol electrometer calibration in the range ± 20 fA to ± 40 fA. The technique used here simulated the condition of a current induced when

The Forthcoming IEEE Standard 1696 on Test Methods for Characterizing Circuit Probes

May 6, 2013
Author(s)
Nicholas Paulter, John Jendzurski, Mike McTigue, Bill Hagerup, Thomas E. Linnenbrink
The Technical Committee 10 (TC10) of the IEEE Instrumentation and Measurement Society initiated a new standards activity in 2006 for the development of test methods to characterize the performance of circuit probes. This standard contains a set of

NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications

April 25, 2013
Author(s)
Bethany E. Hackett, Bradley Moore, Dennis G. Camell
NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications, presents the technical requirements and guidance for the accreditation of laboratories under the NVLAP Electromagnetic Compatibility and Telecommunications (ECT) LAP. It is

Nonlinear acoustic effects in multilayer ceramic capacitors

January 25, 2013
Author(s)
Ward L. Johnson, Sudook A. Kim, Timothy P. Quinn, Grady S. White
Nonlinear resonant acoustics was explored as an approach for nondestructively evaluating the susceptibility of BaTiO3-based multilayer ceramic capacitors to electrical failure during service. The acoustic nonlinearity was characterized through measurements

NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications

December 21, 2012
Author(s)
Bethany E. Hackett, Bradley Moore, Dennis G. Camell
NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications, presents the technical requirements and guidance for the accreditation of laboratories under the NVLAP Electromagnetic Compatibility and Telecommunications (ECT) LAP. It is

Silicon Micromachines for Fun and Profit

December 12, 2012
Author(s)
David Bishop, Flavio Pardo, Cris Bolle, Randy Giles, Vladimir Aksyuk
Over the last decade or so a group of us, while working at Bell Labs, have been able to develop a large number of silicon micromachines for a wide range of applications. In this article, which is part of a special volume to celebrate the career of
Displaying 301 - 325 of 762
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