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Displaying 28126 - 28150 of 73929

Representing Layout Information in the CMSD Specification

August 26, 2009
Author(s)
Frank H. Riddick, Yung-Tsun T. Lee
Developing mechanisms for the efficient exchange of information between simulations and other manufacturing tools is a critical problem. For many areas of manufacturing, neither representations for the information nor mechanisms for exchanging the

Composition and concentration anomalies for structure and dynamics of Gaussian-core mixtures

August 25, 2009
Author(s)
Vincent K. Shen, Mark J. Pond, William P. Krekelberg, Jeffrey R. Errington, Thomas M. Truskett
We report molecular dynamics simulation results for two-component fluid mixtures of Gaussian-core particles, focusing on how tracer diffusivities and static pair correlations depend on temperature, particle concentration, and composition. At low particle

Synthetic Mica: A Very Promising Substrate for Studying Solid Thin Films by Proton NMR

August 25, 2009
Author(s)
David L. VanderHart, Vivek M. Prabhu, Kristopher Lavery, Cindi L. Dennis
We demonstrate that a synthetic fluorophlogopite mica can be used as a proton-free, diamagnetic substrate for examining solid thin-film samples using conventional solid-state proton NMR experiments. The context of this work extends previous NMR studies on

Thin Film Solid State Proton NMR Measurements Using A Synthetic Mica Substrate: Polymer Blends

August 25, 2009
Author(s)
David L. VanderHart, Vivek Prabhu, Kristopher Lavery, Cindi L. Dennis, Ashwin Rao, Eric K. Lin
We demonstrate that a synthetic fluorophlogopite mica can be used as a proton-free, diamagnetic substrate for examining solid thin-film samples using conventional solid-state proton nuclear magnetic resonance (NMR) experiments. The context of this work

193 nm Angle-Resolved Scatterfield Microscope for Semiconductor Metrology

August 24, 2009
Author(s)
Martin Y. Sohn, Richard Quintanilha, Bryan M. Barnes, Richard M. Silver
An angle-resolved scatterfield microscope (ARSM( feating 193 nm excimer laser light wa developed for measuring critical dimension (CD) and overlay of nanoscale targets as used in semiconductor metrology. The microscope is designed to have a wide and

Counterflow and paired superfluidity in one-dimensional Bose mixtures in optical lattices

August 24, 2009
Author(s)
Anzi A. Hu, Ludwig G. Mathey, Ippei Danshita, Eite Tiesinga, Carl J. Williams, Charles W. Clark
We study the quantum phases of mixtures of ultra-cold bosonic atoms held in an optical lattice that confines motion or hopping to one spatial dimension. The phases are found by using Tomonaga-Luttinger liquid theory as well as the numerical method of time

Measuring high-order coherences of chaotic and coherent optical states

August 24, 2009
Author(s)
Martin J. Stevens, Burm Baek, Eric Dauler, Andrew J. Kerman, Richard J. Molnar, Scott A. Hamilton, Karl Berggren, Richard P. Mirin, Sae Woo Nam
We demonstrate a new approach to measuring high-order temporal coherences that uses a four-element superconducting nanowire single-photon detector (SNSPD) in which four independent, single-photon-sensitive elements are interleaved over a single spatial

Spin Transfer Torques by Point-Contact Spin injection

August 24, 2009
Author(s)
Tingyong Chen, Yi Ji, S X. Huang, C L. Chien, Mark D. Stiles
Spin-transfer torques (STT) provide a new mechanism to alter the magnetic configuration in magnetic heterostructures, a feat previously only achieved by an external magnetic field. A current flowing perpendicular through a noncollinear magnetic spin

Interfacial Rheology in Complex Flow

August 23, 2009
Author(s)
Jeffrey D. Martin, Steven Hudson
Typical methods used to measure dynamic interfacial properties of multiphase liquid systems often employ drops that are much larger and flows that are much simpler than those encountered in typical processing applications. A microfluidic approach is used

Polyelectrolyte and Particle Adsorption to Nanopatterned Surfaces

August 23, 2009
Author(s)
Steven D. Hudson, Thuy Chastek
The adsorption of polyelectrolytes and nanoparticles onto patterned and curved surfaces is investigated (by fluorescence and electron microscopy) and exploited to produce anisotropic patchy particles. Various anisotropic properties are necessary for the

The ABCs oF Standards Activities

August 23, 2009
Author(s)
Maureen A. Breitenberg
This report is an introduction to standardization and the U.S. standards system for readers that are not familiar with this topic. It highlights some of the more important aspects of this field; furnishes the reader with both historical and current

Scaling Factors and Uncertainties for ab Initio Anharmonic Vibrational Frequencies

August 21, 2009
Author(s)
Russell D. Johnson III, Karl K. Irikura, Raghu N. Kacker, Ruediger Kessel
To predict the vibrational spectra of molecules, ab initio calculations are often used to compute harmonic frequencies, which are usually scaled by empirical factors as an approximate correction for errors in the force constants and for anharmonic effects

The Extension of the NIST BRDF Scale from 1100 nm to 2500 nm

August 21, 2009
Author(s)
Howard W. Yoon, David W. Allen, George P. Eppeldauer, Benjamin K. Tsai
Measurements of bi-directional reflectance factor for diffuse reflectance from 1100 nm to 2500 nm using extended-range indium gallium arsenide (exInGaAs) detectors in the NIST Spectral Tri-function Automated Reference Reflectometer (STARR) facility are

A moving window correlation method to reduce the distortion of SPM images

August 20, 2009
Author(s)
Wei Chu, Joseph Fu, Ronald G. Dixson, Ndubuisi G. Orji, Theodore V. Vorburger
Many scanning probe microscopes (SPMs), such as the scanning tunneling microscope (STM) and atomic force microscope (AFM), use piezoelectric actuators operating in open loop for generating the scans of the surfaces. However, nonlinearities mainly caused by

Spectroradiometric Characterization of the NIST Pulsed Solar Simulator

August 20, 2009
Author(s)
Howard W. Yoon, Brian P. Dougherty, Vladimir Khromchenko
The spectroradiometric characterization of the NIST indoor pulsed solar simulator is described. The solar simulator has a flash duration of 36.4 ms and is designed for solar panels having a maximum size of 2.0 m by 1.6 m. As per industry standards, the

A 1D Spectral Image Validation/Verification Metric for Fingerprints

August 19, 2009
Author(s)
John M. Libert, John D. Grantham, Shahram Orandi
Image validation and verification are important functions in the acquisition of fingerprint images from live-scan devices and for assessing and maintaining the fidelity of fingerprint image databases. In addition to law enforcement, such databases are used
Displaying 28126 - 28150 of 73929
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