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NIST Authors in Bold

Displaying 28051 - 28075 of 73830

Measuring high-order coherences of chaotic and coherent optical states

August 24, 2009
Author(s)
Martin J. Stevens, Burm Baek, Eric Dauler, Andrew J. Kerman, Richard J. Molnar, Scott A. Hamilton, Karl Berggren, Richard P. Mirin, Sae Woo Nam
We demonstrate a new approach to measuring high-order temporal coherences that uses a four-element superconducting nanowire single-photon detector (SNSPD) in which four independent, single-photon-sensitive elements are interleaved over a single spatial

Spin Transfer Torques by Point-Contact Spin injection

August 24, 2009
Author(s)
Tingyong Chen, Yi Ji, S X. Huang, C L. Chien, Mark D. Stiles
Spin-transfer torques (STT) provide a new mechanism to alter the magnetic configuration in magnetic heterostructures, a feat previously only achieved by an external magnetic field. A current flowing perpendicular through a noncollinear magnetic spin

Interfacial Rheology in Complex Flow

August 23, 2009
Author(s)
Jeffrey D. Martin, Steven Hudson
Typical methods used to measure dynamic interfacial properties of multiphase liquid systems often employ drops that are much larger and flows that are much simpler than those encountered in typical processing applications. A microfluidic approach is used

Polyelectrolyte and Particle Adsorption to Nanopatterned Surfaces

August 23, 2009
Author(s)
Steven D. Hudson, Thuy Chastek
The adsorption of polyelectrolytes and nanoparticles onto patterned and curved surfaces is investigated (by fluorescence and electron microscopy) and exploited to produce anisotropic patchy particles. Various anisotropic properties are necessary for the

The ABCs oF Standards Activities

August 23, 2009
Author(s)
Maureen A. Breitenberg
This report is an introduction to standardization and the U.S. standards system for readers that are not familiar with this topic. It highlights some of the more important aspects of this field; furnishes the reader with both historical and current

Scaling Factors and Uncertainties for ab Initio Anharmonic Vibrational Frequencies

August 21, 2009
Author(s)
Russell D. Johnson III, Karl K. Irikura, Raghu N. Kacker, Ruediger Kessel
To predict the vibrational spectra of molecules, ab initio calculations are often used to compute harmonic frequencies, which are usually scaled by empirical factors as an approximate correction for errors in the force constants and for anharmonic effects

The Extension of the NIST BRDF Scale from 1100 nm to 2500 nm

August 21, 2009
Author(s)
Howard W. Yoon, David W. Allen, George P. Eppeldauer, Benjamin K. Tsai
Measurements of bi-directional reflectance factor for diffuse reflectance from 1100 nm to 2500 nm using extended-range indium gallium arsenide (exInGaAs) detectors in the NIST Spectral Tri-function Automated Reference Reflectometer (STARR) facility are

A moving window correlation method to reduce the distortion of SPM images

August 20, 2009
Author(s)
Wei Chu, Joseph Fu, Ronald G. Dixson, Ndubuisi G. Orji, Theodore V. Vorburger
Many scanning probe microscopes (SPMs), such as the scanning tunneling microscope (STM) and atomic force microscope (AFM), use piezoelectric actuators operating in open loop for generating the scans of the surfaces. However, nonlinearities mainly caused by

Spectroradiometric Characterization of the NIST Pulsed Solar Simulator

August 20, 2009
Author(s)
Howard W. Yoon, Brian P. Dougherty, Vladimir Khromchenko
The spectroradiometric characterization of the NIST indoor pulsed solar simulator is described. The solar simulator has a flash duration of 36.4 ms and is designed for solar panels having a maximum size of 2.0 m by 1.6 m. As per industry standards, the

A 1D Spectral Image Validation/Verification Metric for Fingerprints

August 19, 2009
Author(s)
John M. Libert, John D. Grantham, Shahram Orandi
Image validation and verification are important functions in the acquisition of fingerprint images from live-scan devices and for assessing and maintaining the fidelity of fingerprint image databases. In addition to law enforcement, such databases are used

An Other-Race Effect for Face Recognition Algorithms

August 19, 2009
Author(s)
P J. Phillips, Alice J. O'Toole, Fang Jiang, Abhijit Narvekar, Julianne Ayadd
Psychological research indicates that humans recognize faces of their own race more accurately than faces of other races. This "other-race effect" occurs for algorithms tested in a recent international competition for state-of-the-art face recognition

Enabling Flexible Manufacturing Systems by Using Level of Automation as Design Parameter

August 19, 2009
Author(s)
Bjoern J. Johansson, Asa Fasth, Johan Stahre, Juhani Heilala, Swee K. Leong, Yung-Tsun T. Lee, Frank H. Riddick
Handling flexibility in an ever changing manufacturing environment is one of the key challenges for a successful industry. By using tools for virtual manufacturing, industries can analyze and predict outcomes of changes before taking action to change the

Glassy Carbon as an Absolute Intensity Calibration Standard for Small Angle Scattering

August 19, 2009
Author(s)
Andrew J. Allen, Jan Ilavsky, Fan Zhang, Gabrielle G. Long, Pete R. Jemian
Absolute calibration of small-angle scattering (SAS) intensity data (in units of differential cross-section per unit sample volume per unit solid angle) is essential for many important aspects of quantitative SAS analysis, such as obtaining the number

High-Fidelity Quantum Control Using 9Be+ Ion Crystals in a Penning Trap

August 19, 2009
Author(s)
Michael J. Biercuk, Hermann Uys, Aaron Vandevender, Nobuyasu Shiga, Wayne M. Itano, John J. Bollinger
We provide an introduction to the use of ion crystals in a Penning trap for experiments in quantum information. Macroscopic Penning traps allow for the containment of a few to a few million atomic ions whose internal states may be used in quantum

System Builders Manual for Version 2.1.5 of the NIST DMIS Test Suite

August 19, 2009
Author(s)
Thomas R. Kramer, John A. Horst
This is a system builders manual for the NIST DMIS Test Suite, version 2.1.5. The purpose of the manual is to help system builders use software provided in the test suite for building systems that implement DMIS (the Dimensional Measuring Interface
Displaying 28051 - 28075 of 73830
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