U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 26301 - 26325 of 73929

Reflectance Factor Measurement Complications Due to Near Infrared Fluorescence

September 1, 2010
Author(s)
Maria E. Nadal, Carl C. Miller, Clarence J. Zarobila
The researchers at the National Institute of Standards and Technology (NIST) have found that the widely used orange and red color tiles unexpectedly exhibit near infrared fluorescence. An analysis of the effect this fluorescence component has on the

Semantic B2B-integration Using an Ontological Message Metamodel

September 1, 2010
Author(s)
Marko Vujasinovic, Nenad Ivezic, Edward J. Barkmeyer Jr., Zoran Marjanovic
E-Business applications are often required to use different, incompatible, message sets to implement message interfaces for a business-to-business (B2B) communication. This makes communication with every new partner a new interoperability problem. In this

Striation Density for Predicting the Identifiability of Fired Bullets

September 1, 2010
Author(s)
Wei Chu, Jun-Feng Song, Theodore V. Vorburger, Susan M. Ballou
Without a selection procedure to exclude the bullets having insufficient individualized ballistics signature, automated ballistics identification systems will correlate an evidence bullet with all reference bullets stored in the database. Correlations that

Synthesis and Electronic Properties of the Misfit Layered Compound [(PbSe)1.00]1[MoSe2]1

September 1, 2010
Author(s)
Ian M. Anderson, Michael D. Anderson, Andrew A. Herzing, Colby Heideman, Raimar Rostek, David C. Johnson
An ultra-low thermal conductivity compound with the ideal formula [(PbSe)1.00]1[MoSe2]1 has been successfully crystallized across a range of compositions. The lattice parameters varied from 12.41 Å to 12.75 Å and the quality of the observed 00ℓ diffraction

The Development of a Unified Time and Frequency Program in the SIM Region

September 1, 2010
Author(s)
Michael A. Lombardi, J. Mauricio Lopez-Romero
The Sistema Interamericano de Metrologia (SIM) is one of five major regional metrology organizations (RMOs) recognized by the Bureau International des Poids et Mesures (BIPM). SIM is composed of the national metrology institutes (NMIs) located in the 34

The effect of shade trees on summertime electricity use in Sacramento, California

September 1, 2010
Author(s)
Geoffrey Donovan, David Butry, Joshua D. Kneifel
Although previous studies have shown that shade trees can reduce summertime electricity use, none have compared these reductions to other common energy-conservation measures. We demonstrate that a 30-year old tree planted on the west side of a house in

Translational Considerations for Cancer Nanomedicine

September 1, 2010
Author(s)
Stephen T. Stern, Jennifer B. Hall, Lee L. Yu, Laura J. Wood, Giulio F. Paciotti, Lawrence Tamarkin, Stephen E. Long, Scott E. McNeil
There are many important considerations during preclinical development of cancer nanomedicines, including: 1) unique aspects of animal study design; 2) the difficulties in evaluating biological potency, especially for complex formulations; 3) the

Variations in Cross-link Density with Deposition Pressure in Ultrathin Plasma Polymerized Benzene and Octafluorocyclobutane Films

September 1, 2010
Author(s)
Someswara R. Peri, Brian Habersberger, Bulent Akgun, Hao Jiang, Jesse Enlow, Timothy J. Bunning, Charles Majkrzak, Mark D. Foster
For ultrathin, plasma polymerized (PP) films, variations in structure with depth near the substrate and near the surface are much more readily apparent than in thick films. Neutron reflectometry (NR) measurements of ultrathin PP-films from

X-Ray Spectroscopy of Highly Charged Ions in Laboratory and Astrophysical Plasmas

September 1, 2010
Author(s)
E. H. Silver, N Brickhouse, T. Lin, G X. Chen, K. Kirby, John D. Gillaspy, Joseph N. Tan, J M. Laming
This paper presents (1) new laboratory data on the x-ray spectra of He-like Ar XVII over a broad spectral range (300-3500 eV) at high resolution (2) the results of new measurements of K-shell x- ray reference lines in carbon, oxygen, iron, copper, and

Development of a MEMS based Dynamic Rheometer

August 31, 2010
Author(s)
Gordon Christopher, Jae M. Yoo, Nicholas G. Dagalakis, Steven D. Hudson, Kalman D. Migler
Rheological methods that interrogate nano-liter scale volumes of fluids and solids have advanced considerably over the past decade, yet there remains a need for methods that probe the frequency dependent complex rheological moduli through application of

Framework and Indicators for a Sustainable Manufacturing Mapping Methodology

August 31, 2010
Author(s)
Marja Paju, Juhani Heilala, Markku Hentula, Antti Heikkila, Bjorn Johansson, Swee K. Leong, Kevin W. Lyons
Increasing numbers of companies in the manufacturing industry have identified market potential for implementing sustainable and green manufacturing. Yet, current sustainability assessment tools for companies are complicated, requiring vast amounts of data

Introduction: Cybersecurity

August 31, 2010
Author(s)
David R. Kuhn
Enterprise security, often considered a burden for system administrators and users alike, is one of the most rapidly evolving areas of IT. The articles in this issue can help IT professionals who want to be intelligent providers or consumers of secure

OntoSTEP: Enriching Product Model Data Using Ontologies

August 31, 2010
Author(s)
Raphael Barbau, Sylvere I. Krima, Xenia Fiorentini, Sudarsan Rachuri, Anantha Narayanan Narayanan, Sebti Foufou, Ram D. Sriram
The representation and management of product lifecycle information is critical to the success of any manufacturing organization. Different modeling languages are adopted to represent different product information, for example EXPRESS for geometry as seen

Summary of the NIST Workshop on Sustainable Manufacturing: Metrics, Standards, and Infrastructure

August 31, 2010
Author(s)
Sudarsan Rachuri, Ram D. Sriram, Anantha Narayanan Narayanan, Prabir Sarkar, Jae H. Lee, Kevin W. Lyons, Vijay Srinivasan, Sharon J. Kemmerer
This paper summarizes the presentations, discussions, and recommendations of the NIST Workshop Sustainable Manufacturing: Metrics, Standards, and Infrastructure held at NIST, Gaithersburg, Maryland, USA, October 13th through October 15th, 2009. The primary

System Testing Using Use Cases for Simulation Model of an Emergency Room

August 31, 2010
Author(s)
Guodong Shao
Modeling and simulation (M&S) techniques are increasingly being used to solve problems and aid decision making in many different fields. It is particularly useful for Department of Homeland Security (DHS) applications because of its feature of non
Displaying 26301 - 26325 of 73929
Was this page helpful?