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Search Publications

NIST Authors in Bold

Displaying 2476 - 2500 of 13215

Review of SI Traceable Force Metrology for Instrumented Indentation and Atomic Force Microscopy

September 23, 2005
Author(s)
David B. Newell, John A. Kramar, Jon R. Pratt, Douglas T. Smith
… indentation and atomic force microscopy (AFM), and in particular focuses on new electrical and deadweight … force developed at the National Institute of Standards and Technology (NIST). These standards provide metrological … engineered surfaces, and micro and nanoscale devices in terms of forces that are expressed in internationally …

Electrochemical Surface Finishing and Energy Storage Technology with Room-Temperature Haloaluminate Ionic Liquids and Mixtures

April 8, 2017
Author(s)
Gery R. Stafford
… we review the progress in the area of electrochemical technology with Lewis acidic haloaluminate room-temperature … In this review, we have categorized the electrochemical technology based on these RTILs into two topics: … Electrochemical Surface Finishing and Energy Storage Technology with Room-Temperature Haloaluminate Ionic Liquids …

First Direct Experimental Studies of Hf0.5Zr0.5O2 Ferroelectric Polarization Switching Down to 100-picosecond in Sub-60mV/dec Germanium Ferroelectric Nanowire FETs

June 18, 2018
Author(s)
Wonil Chung, Mengwei Si, Pragya Shrestha, Jason Campbell, Kin P. Cheung, Peide Ye
… In this work, ultrafast pulses with pulse widths ranging from … 2018 Symposia on VLSI Technology and Circuits … 2018 Symposium on VLSI Technology Digest of Technical Papers … Polarization Switching Down to 100-picosecond in Sub-60mV/dec Germanium Ferroelectric Nanowire FETs …

Thermally Induced Deformations in a Flip-Chip HDI Substrate

May 1, 2000
Author(s)
Elizabeth S. Drexler
… At issue was the thermomechanical response of microvias in a high-density interconnect (HDI) substrate. The HDI … was thermally cycled five times between -55 and 125 C in a scanning electron microscope. The electron-bea moire technique was used to measure displacements in the package at the temperature extremes and to measure …

International Space Station Utilization for Radiometric Calibration Support to Earth Remote Sensing Program

January 19, 2000
Author(s)
E A. Thompson, Raju V. Datla, Robert D. Saunders, Albert C. Parr
… manned and maintained NIST/SI traceable standard sensors in the visible, IR and microwave spectral regions to augment … of other remote sensing sensors is being well received in the calibration community. Review of the current state of the art in solar monitoring as evidenced by intercomparison between …

Performance evaluation of laser trackers using the network method

July 30, 2020
Author(s)
Ling Wang, Balasubramanian Muralikrishnan, Octavio Icasio Hernandez, Craig M. Shakarji, Daniel S. Sawyer
… trackers (LTs) are widely used for dimensional metrology in a variety of large-scale manufacturing and assembly operations. Their performance … to ensure the reliability of data obtained using LTs. In this context, we discuss practical issues involved in … Measurement Science and Technology …

Graphene oxide/waterborne polyurethane nanocoatings: Effects of graphene oxide content on performance properties

January 15, 2020
Author(s)
David G. Goodwin, Coralie Bernard, Xiaohong Gu, Mat Celina, Marc R. Nyden, Deborah S. Jacobs, Li Piin Sung, Tinh Nguyen
… physical and mechanical properties, good dispersibility in water, and low cost. Here, we report on the performance of … mass). The results show that GO sheets were well-dispersed in, and have a good adhesion with WPU. At 2 % mass loading, … properties combined with the ease of processing and low manufacturing cost suggest that GO is an economically viable …

Determining sample alignment in X-ray Reflectometry using thickness and density from GaAs/AlAs multilayer certified reference materials

September 8, 2014
Author(s)
Donald Windover, David L. Gil, Yasushi Azuma, Toshiyuki Fujimoto
… and parameter estimation accuracy is somewhat opaque. In this study, we intentionally shift incident angle information contained in a high-quality XRR data set and refine this shifted data … measurement misalignment from buried AlAs and GaAs layers, in contrast to the surface layers, which show the most …

Experiment-based modelling of a vapor draw ampoule used for low-volatility precursors

October 22, 2019
Author(s)
Brent A. Sperling, James E. Maslar
… layer deposition processes used for microelectronics manufacturing. To aid in addressing this problem, we have recently developed an … from a commercial vapor draw ampoule. Parameters used in the model are obtained by fitting the performance of the … Journal of Vacuum Science and Technology B …

NBS Vision System in the AMRF

August 31, 1988
Author(s)
M Nashman, K Chaconas
… Group of the Robotics System Division which is used in the Automated Manufacturing Research Facility (AMRF). It discusses the objectives of the Vision System and its applications in the factory environment. Since the Vision System is a … Automated Manufacturing Research Facility, computer vision, …

Process Specification Language (PSL): Results of the First Pilot Implementation

January 1, 1999
Author(s)
Craig I. Schlenoff, Michael Gruninger, Mihai Ciocoiu, Donald E. Libes
… In all types of communication, the ability to share … it is viewed and interpreted. This is especially true in manufacturing because of the growing complexity of … (PSL) effort at the National Institute of Standards and Technology whose goal is to identify, formally define, and …
Displaying 2476 - 2500 of 13215
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