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Displaying 2001 - 2025 of 13215

Cross-Display-Technology Video Motion Measurement Tools

February 23, 2006
Author(s)
John W. Roberts, Edward A. Fanning, Hassan A. Sahibzada
… actual differences (if any) seen by a human viewer. Cross-technology measurement tools are necessary to ensure the … Cross-Display-Technology Video Motion Measurement Tools …

Modeling Particle Transport in Lithographically-Directed, Evaporation-Driven Self-Assembly Systems

January 1, 2007
Author(s)
John Dyreby, K Turner, G Nellis, James Alexander Liddle
… self-assembly (EDSA) of nanoparticles is a promising manufacturing technique that combines the control of top-down … considers the macro-scale distribution of the particles in the colloidal solution. The distribution is determined by … flows generated within a volume of fluid that is changing in size under various pinning conditions. The shape of the …

Why You Should Be Interested in Technology Roadmaps for Compound Semiconductors

October 21, 2001
Author(s)
Herbert S. Bennett
… about the need for an international consensus or technology roadmap concerning selected compound … for why there needs to be more wide-spread involvement in technology roadmaps for compound semiconductors. The … devices are three areas from among many areas for which technology roadmaps would be appropriate. …

The transient behavior of NBTI - A new prospective

October 17, 2008
Author(s)
Kin P. Cheung, Jason P. Campbell
… is currently one of the most serious reliability issues in advanced CMOS technology. Specifically, the fast recovery of NBTI … Conference on Solid-State and Integrated-Circuit Technology … Conference on Solid-State and Integrated-Circuit Technology …

Steady Melting in Material Extrusion Additive Manufacturing

July 5, 2023
Author(s)
Austin Colon, David Kazmer, Amy Peterson, Jonathan Seppala
… main causes of defects within material extrusion additive manufacturing is the non-isothermal condition in the hot end, … main causes of defects within material extrusion additive manufacturing is the non-isothermal condition in the hot end, … Steady Melting in Material Extrusion Additive Manufacturing …

Strategic Plan 2010

April 21, 2010
Author(s)
Gerald T. Fraser
… The Optical Technology Division s 2010 Strategic Plan defines the … NIST Physics Lab/Optical Technology Division … optical radiation, optical technology, satellite calibration, stellar calibration, …

Bearing Metrics for Health Monitoring of Machine Tool Linear Axes

June 13, 2019
Author(s)
Gregory W. Vogl, Brian C. Galfond, Jordan Jameson
… (IMU), along with nine signal features, to measure changes in geometric error motions due to induced faults on the … machine tool, smart manufacturing, linear axis, ball bearing, wear, degradation, … 2019 Manufacturing Science and Engineering Conference (MSEC 2019) …

Calculation Tools at SP Fire Technology. (Abstract/Presentation/Visuals)

May 1, 2003
Author(s)
P VanHees, B Sundstrom
… The Centre for Combustion Science and Technology, CECOST, was founded in 1996 at the Lund Institute of Technology, in close collaboration with Chalmers University of Technology and the Royal Institute of Technology. The Centre … Calculation Tools at SP Fire Technology. (Abstract/Presentation/Visuals) …

IEEE TC-10: Update 2006

April 1, 2006
Author(s)
Nicholas Paulter, W. B. Boyer, Thomas E. Linnenbrink, S. J. Tilden
… Instrumentation and Measurement Technology Conference … Instrumentation and Measurement Technology Conference …

X-ray Metrology for the Semiconductor Industry Tutorial

February 1, 2019
Author(s)
Daniel F. Sunday, Wen-Li Wu, Scott Barton, Regis J. Kline
… The semiconductor industry is in need of new, in-line dimensional metrology methods with … for CDSAXS and the necessary improvements in X-ray source technology. Expected audience include semiconductor … short course at the National Institute of Standards and Technology on Aug. 25, 2016. …

Carbon Weight Analysis for Machining Operation and Allocation for Redesign

December 16, 2009
Author(s)
Gaurav Ameta, Mahesh Mani, Sudarsan Rachuri, Kevin W. Lyons, Shaw C. Feng, Ram D. Sriram
… weight (CW) - often referred to as carbon footprint, in manufacturing processes from the part level to assembly level. In this initial study we focused on machining operations, … carbon weight (CW), manufacturing process, mechanical tolerancing, machining …

Building an Information Technology Security Awareness and Training Program

October 1, 2003
Author(s)
Mark Wilson, Joan Hash
… NIST Special Publication 800-50, Building An Information Technology Security Awareness and Training Program, provides guidance for building an effective information technology (IT) security program and supports requirements … to NIST Special Publication 800-16, Information Technology Security Training Requirements: A Role- and …

Reconstruction of the Thermal Environment in the Tall World Trade Center Buildings

January 11, 2013
Author(s)
Richard G. Gann, Anthony P. Hamins, Kevin B. McGrattan, Thomas J. Ohlemiller, Kuldeep R. Prasad, William M. Pitts, Harold E. Nelson
… The National Institute of Standards and Technology (NIST) conducted an extensive investigation of the … Fire Technology … Reconstruction of the Thermal Environment in the Tall World Trade Center Buildings …

Federal Agency Use of Public Key Technology for Digital Signatures and Authentication

October 1, 2000
Author(s)
K L. Lyons-Burke, FPKIS Committee
… agencies that are considering the use of public key technology for digital signatures or authentication over open … groups, and state and local governments. Most public key technology applications for digital signatures provide for user authentication as well. However, public key technology can be used for user authentication only without …

Semiconductor Factory and Equipment Time Synchronization

February 25, 2004
Author(s)
Ya-Shian Li-Baboud, Brad Van Eck
… With the advent of e-manufacturing including automated process control (APC), such … capabilities. The data must be 'time stamped' in order to be useful to the applications for which it is … stamps the clocks used must be accurately synchronized. In order to accommodate future needs, the semiconductor …
Displaying 2001 - 2025 of 13215
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