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NIST Authors in Bold

Displaying 1951 - 1975 of 13215

Digital Signature Standard (DSS)

January 27, 2000
Author(s)
National Institute of Standards and Technology (NIST), Elaine Barker
… National Institute of Standards and Technology (NIST), Elaine Barker …

Secure Hash Standard (SHS)

April 17, 1995
Author(s)
National Institute of Standards and Technology (NIST), Elaine Barker
… National Institute of Standards and Technology (NIST), Elaine Barker …

Escrowed Encryption Standard

February 9, 1994
Author(s)
National Institute of Standards and Technology (NIST), Miles E. Smid
… National Institute of Standards and Technology (NIST), Miles E. Smid …

Automated Password Generator (APG)

October 5, 1993
Author(s)
National Institute of Standards and Technology (NIST), Charles Dinkel
… National Institute of Standards and Technology (NIST), Charles Dinkel …

Secure Hash Standard (SHS)

May 11, 1993
Author(s)
National Institute of Standards and Technology (NIST), Elaine Barker
… National Institute of Standards and Technology (NIST), Elaine Barker …

A Security Perspective on the Web3 Paradigm

February 25, 2025
Author(s)
Dylan Yaga, Peter Mell
… that should be addressed when considering Web3 technology and adoption. … Blockchain, web3, decentralized, distributed, future technology, decentralized identifiers …

Reference Material to Improve Reliability of Building Product VOC Emissions Testing

February 4, 2013
Author(s)
Cynthia H. Reed, Zhe Liu, Steve Cox, John Little
… a significant source of volatile organic compounds (VOC) in the indoor environment. Reducing VOC emissions can improve … laboratory measurement of a product’s VOC emission rate in a test chamber. Test chamber emission rates are then … is common to see large coefficients of variation (> 40 %) in material emission rates measured between different …

A Roadmap to Advance Measurement Science in Robot Dexterity and Manipulation

May 1, 2014
Author(s)
Joseph A. Falco, Jeremy A. Marvel, Elena R. Messina
… In order for robots to expand their applicability within manufacturing operations, their dexterity needs to advance considerably. There is active research in many areas that is contributing to creating a new … A Roadmap to Advance Measurement Science in Robot Dexterity and Manipulation …

An Intelligent Ultrasonic Flowmeter for Improved Flow Measurement and Flow Calibration Facility

May 1, 2001
Author(s)
Tsyh Tyan Yeh, Pedro I. Espina, S A. Osella
… dynamic properties of a calibration facility. Ultrasonic technology is evolving rapidly these technical advances can significantly improve flow measurement in the continuous process industries. The AUFM couples … and their probability of existence. The knowledge encoded in the AUFM is derived from training exercises that use …

HEB FPA Imaging Technology for Security and Biomedical Applications

September 19, 2005
Author(s)
Eyal Gerecht, Dazhen Gu, Sigfrid Yngvesson, Fernando Rodriguez-Morales, Ric Zannoni, John Nicholson
… integrated with MMIC IF amplifiers in a single block. HEB technology is becoming the basis for advanced terahertz … HEB FPA Imaging Technology for Security and Biomedical Applications …

Documentary and Physical Standards for Surface Finish and Imperfections

February 1, 2001
Author(s)
Theodore V. Vorburger
… properties of optical surfaces because they are caused by manufacturing limitations or defects and are linked to … fine irregularities that cause scattering and stray light in optical systems. "Imperfections" is a general term to … and scattering measurements. For surface imperfections in optics, dig and scratch standards were described in …

Variant selection and macrozone in Ti-6Al-4V walls during laser hot wire direct energy deposition

November 17, 2024
Author(s)
Rajib Halder, Souvik Sahoo, Jake Benzing, Alec Saville, Anthony Rollett
… aerospace components suffer from the spatial variations in mechanical properties, texture-mediated anisotropy, and … The development of texture and macrozone formation in titanium alloys are closely related to the variant … selection during the phase transformation in the additive manufacturing process. In this study, electron backscatter …

The Study of Silicon Stepped Surfaces as Atomic Force Microscope Calib Standards With a Calibrated AFM at NIST

September 29, 2005
Author(s)
V W. Tsai, Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, R Koning, Richard M. Silver, Edwin R. Williams
… Due to the limitations of modern manufacturing technology, there is no commercial height … AFM (C-AFM), is used to measure this type of surface. In this paper, the results of six sets of measurements made … Chapter in: Characterization and Metrology for ULSI Technology 2005 ; D.G. Seiler et. al., Editors …

Concealment and Obstacle Detection for Autonomous Driving

October 1, 1999
Author(s)
Tommy Chang, Tsai Hong Hong, Steven Legowik, Marilyn N. Abrams
… both the sensors and the supporting software used in our system for driving autonomously on cross-country … developed at the National Institute of Standards and Technology (NIST) for detecting obstacles and regions of … general obstacles (positive, negative, and concealment.) In addition to using information provided by the EBK sensor, …
Displaying 1951 - 1975 of 13215
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