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Search Publications

NIST Authors in Bold

Displaying 6026 - 6050 of 13218

TOWARDS THE SYNTHESIS OF PRODUCT KNOWLEDGE ACROSS THE LIFECYCLE

November 21, 2013
Author(s)
Paul W. Witherell, Boonserm Kulvatunyou, Sudarsan Rachuri
… information for both upstream and downstream applications. In this paper, we review previous and ongoing efforts to use … to this information and facilitating lifecycle thinking. In exploring the concept of PLUTO, we discuss the use of … to leverage the PLUTO model to support lifecycle thinking in terms of sustainable impact. …

TOWARDS CONTINUOUSLY UPDATED SIMULATION MODELS: Combining Automated Raw Data Collection and Automated Data Processing

December 10, 2010
Author(s)
John L. Michaloski, Anders Skoogh, Nils Bengtsson
… (DES) is a powerful tool for efficiency improvements in production. However, instead of integrating the tool in the daily work of production engineers, companies apply it mostly in single-purpose studies such as major investment projects. … MTConnect, Statistics, middleware, Data acquisition, Manufacturing …

Making Interoperability Happen

June 26, 2006
Author(s)
John A. Horst
… interface, interface language, Interoperability, manufacturing, Metrology, Standards, standards, vendors …

Nonlinear Dynamics Model for Chip Segmentation in Machining

November 30, 1997
Author(s)
Timothy J. Burns, Matthew A. Davies
… We have developed a new model for chip formation in machining which includes a mechanism for thermomechanical … of metal cutting as a process which is similar in many ways to an open chemical reactor. As the cutting … Chip Formation, High speed machining, Manufacturing Processes, Nonlinear dynamics …

Agile for Model-Based-Standards Development

March 29, 2021
Author(s)
Brandon Sapp, Melissa Harvey, Marion Toussaint, Sylvere Krima, Allison Barnard Feeney, Herve Panetto
… Advanced Manufacturing Series (NIST AMS) - 100-40 …

Real-Time Operating System Timing Jitter and its Impact on Motor Control

October 29, 2001
Author(s)
Frederick M. Proctor, William P. Shackleford
… OnTime and RTX for Windows NT. Timing jitter is an issue in these systems, due to hardware effects such as bus … sections, disabled interrupts, and multiple code paths in the scheduler. Jitter is typically on the order of a … operating systems, and ranges from milliseconds to seconds in the worst case for soft real-time operating systems. The …

Performance Measures of a Robotic Micropositioner

June 1, 1988
Author(s)
Jonathan W. Lee, James S. Albus, Nicholas G. Dagalakis, T M. Tsai
… algorithm for path tracing is formulated and tested. In this work the performance of the micropositioner is … 2nd International Symposium on Robotics and Manufacturing ASME …

Effects of Lightpipe Proximity on Si Wafer Temperature in Rapid Thermal Processing Tools

September 1, 2003
Author(s)
Kenneth G. Kreider, D H. Chen, D P. DeWitt, William A. Kimes, Benjamin K. Tsai
… (LPRTs) are the preferred temperature monitoring sensor in most rapid thermal processing (RTP) tools for … oxide formation, and other high temperature processing. In order to assure uniform wafer temperatures during … flux on the wafer. Therefore, only minimal disturbances in the chamber reflectivity are permitted for the sensors and …

Effects of Lightpipe Proximity on Si Wafer Temperature in Rapid Thermal Processing Tools

September 1, 2003
Author(s)
Kenneth G. Kreider, D H. Chen, D P. DeWitt, William A. Kimes, Benjamin K. Tsai
… curate temperature measurements are critical in rapid thermal processing (RTP) of silicon wafers for … Wafer temperature measurements are frequently performed in a highly reflecting chamber to obtain a near-unity … (0.1) and therefore reduces the temperature of the wafer in proportion to its proximity to the wafer or view factor. …

In Situ Optical Diagnostics of Silicon Chemical Vapor Deposition Gas-Phase Processes

September 1, 2003
Author(s)
James E. Maslar, Wilbur S. Hurst
… thermal chemical vapor deposition, reactions occurring in the gas phase above the wafer surface can strongly … via silane pyrolysis. Measurements were performed in a vertical flow, rotating disk reactor under various … in situ Raman spectroscopy, silane pyrolysis, silicon thermal …

Monitoring Sheath Voltages and Ion Energies in High-Density Plasmas Using Noninvasive Radio-Frequency Current and Voltage Measurements

September 1, 2003
Author(s)
Mark A. Sobolewski
… (IEDs) that is suitable for use during actual processing in commercial plasma reactors. The method was validated by tests performed in argon and CF4 discharges at 1.3 Pa to 3.1 Pa, in an inductively coupled, high-density plasma reactor, with … Conference on Characterization and Metrology for ULSI Technology | 2003 | Characterization and Metrology for ULSI …

NEXAFS Measurements of the Surface Chemistry of Chemically Amplified Photoresists

September 1, 2003
Author(s)
E Jablonski, M Angelopoulos, H Ito, Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, S Sambasivan, Daniel A. Fischer, Ronald L. Jones, Eric K. Lin, Wen-Li Wu, D L. Goldfarb, K Temple
… to interfacial and surface phenomena that cause deviations in the desired lithographic pattern such as T-topping and … kinetics. A significant technical challenge lies in measuring the surface composition and extent of reaction … Characterization and Metrology for ULSI Technology, International Conference | | Characterization and …

MatML: XML for Information Exchange With Materials Property Data

October 12, 2021
Author(s)
A S. Varde, E F. Begley, S Fahrenholz-Mann
… It provides a medium of communication for users in materials science and related fields such as manufacturing and aerospace. It sets the stage for the … of semantic web standards to enhance knowledge discovery in materials science and related areas. …

Chip-level Security for RFID Smart Cards and Tags

September 4, 2007
Author(s)
Dylan Williams, Kate Remley
This report on RFID chip-level security is written to help both technical and non-technical audiences navigate the complex chip-level security features of RFID smart cards and tags, and make intelligent security choices. The report explores both attacks

Friend or Foe? Communication Gateways

April 1, 1998
Author(s)
Steven T. Bushby
… Gateways play an important role in integrating building automation system components made by … This article explores the role gateways play in this application and describes benefits and limitations … by building owners when evaluating the use of gateways in their building automation system. Specific examples using …

MODELING OF U.S. CORN ETHANOL INDUSTRIAL GROWTH

April 13, 2011
Author(s)
Deogratias Kibira, Guodong Shao, Stephen Nowak
… as a transportation fuel is experiencing rapid growth in the United States. The demand is driven by increased … on profitability by both suppliers and producers. This in turn will be influenced by several factors such as demand, … will the projected growth of the corn ethanol industry in the United States be influenced by some or all of these …

AlGaAs Composition Measurements from In Situ Optical Reflectance

July 1, 2000
Author(s)
Kristine A. Bertness, J T. Armstrong, Ryna B. Marinenko, Larry Robins, Albert J. Paul, Joseph G. Pellegrino, Paul M. Amirtharaj, Deane Chandler-Horowitz
… of AlGaAs layers during epitaxial crystal growth using in situ normal-incidence optical reflectance supported by … AlGaAs, composition measurement, compound semiconductors, in situ monitoring, molecular beam epitaxy, optical … Conf. Dig., LEOS Summer Topical on Optical Sensing in Semiconductor Manufacturing …

Measurements of the LIGO Pathfinder Optics

November 1, 1997
Author(s)
R E. Parks, Christopher J. Evans, P Sullivan, Lianzhen Shao, B Loucks
… A number of 150 mm apertures in 250 mm diameter plano-concave optics with figure errors of … Proceedings of SPIE, Optical Manufacturing and Testing II, H. Philip Stahl, Editor …
Displaying 6026 - 6050 of 13218
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