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NIST Authors in Bold

Displaying 5251 - 5275 of 13218

High-Speed Grinding of Silicon Nitride with Electroplated Diamond Wheels, I. Wear and Wheel Life

January 3, 2000
Author(s)
T W. Hwang, Christopher J. Evans, Eric P. Whitenton, S Malkin
… with wheel wear and wheel life, and a second paper [1] in this journal with wheel topography and grinding … may be enhanced at higher wheel speeds due to a reduction in the undeformed chip thickness. Grinding experiments were … expectations, the faster wheel speed gave no improvements in surface finish, grinding ratio, or wheel life. Microscopic …

Stylus Flight in Surface Profiling

January 1, 1996
Author(s)
Jun-Feng Song, Theodore V. Vorburger
… In this paper, theoretical and experimental work on stylus … Journal of Manufacturing Science and Engineering-Transactions of the ASME … Stylus Flight in Surface Profiling …

Control of Flexible Robot Arm

December 31, 1987
Author(s)
Jonathan W. Lee, L Haynes, B Wang, T M. Tsai
… derived rigorously. This arm has two degrees of freedom in rotation and one in translation so that the workspace is three-dimensional. … Modelings and Control of Robotic Manipulators and Manufacturing Processes …

Nano- and Atom-scale Length Metrology

October 1, 2010
Author(s)
Theodore V. Vorburger, Ronald G. Dixson, Ndubuisi G. Orji, Joseph Fu, Richard A. Allen, Michael W. Cresswell, Vincent A. Hackley
… of length at the nano-scale have increasing importance in manufacturing, especially in the electronics and biomedical industries. The properties …

Tolerancing Form Deviations for Rockwell Diamond Indenters

September 1, 2002
Author(s)
Jun-Feng Song, Samuel R. Low III, Li Ma
… of the diamond. This can cause significant differences in the hardness readings. In order to control that effect, tolerances for form error … by experimental results. Based on these results, as manufacturing and measurement techniques for Rockwell diamond …

Understanding Interfacial Deviations in Lithographic Pattern Profiles

February 1, 2002
Author(s)
Joseph~undefined~undefined~undefined~undefined~undefined Lenhart
… patterns on wafers and it accounts for about 35 % of the manufacturing cost of todays IC chip. As IC chip feature … challenging (e.g., well defined features less than 100 nm in dimension with line edge roughness … Understanding Interfacial Deviations in Lithographic Pattern Profiles …

National Institute of Justice Standard for Hand-Held Metal Detectors for Use in Concealed Weapon and Contraband Detection

September 1, 2000
Author(s)
Nicholas G. Paulter Jr.
… NIJ Standard-0602.01, Hand-Held Metal Detectors for Use in Concealed Weapon and Contraband Detection, is an equipment … Standards of the National Institute of Standards and Technology. It is produced as part of the Law Enforcement and … send suggestions to the Director, Office of Science and Technology, National Institute of Justice, U.S. Department of …

Electroacoustic Analysis in Processing of Advanced Ceramics

September 1, 1998
Author(s)
Vincent A. Hackley, U Paik
… suspensions are recognized as playing a critical role in many important industrial processes. Many of these systems … held at the National Institute of Standards and Technology in Gaithersburg, Maryland, on August 4-6, 1997. … specialists, and current and potential users of this technology, to stimulate communication and interaction in …

3rd Annual Electronic Book 2000 Conference and Show Changing the Fundamentals of Reading Proceedings

September 1, 2000
Author(s)
V R. McCrary
… another phenomenon that was beginning to manifest itself in our lives: digital convergence. Digital convergence is the … to this phenomenon as digital convergence starts to unfold in our every day lives: telephony and network becomes voice … the world's first ebook conference was sponsored by NIST in 1998, the industry has grown enormously in size, interest, …

Materials Knowledge Systems in Python - A Data Science Framework for Accelerated Development of Hierarchical Materials

March 15, 2017
Author(s)
David Brough, Daniel Wheeler, Surya R. Kalidindi
… of materials internal structure at multiple length scales in order to extract relevant and transferable knowledge. Data … of materials knowledge, and its transference to design and manufacturing experts. The Materials Knowledge Systems in Python project (PyMKS) is the first open source materials …

Product Models and Virtual Prototypes in Mechanical Engineering

January 1, 1995
Author(s)
Mike Pratt
… of the modelling and virtual prototyping techniques used in product realization, with emphasis on the mechanical … field. It is pointed out that virtual prototypes, in the commonly accepted sense of computer models permitting … different aspects of the intended functionality or manufacturing requirements of the modelled artifact. …

Practical Fin Shapes for Surface-Tension-Drained Condensation

May 1, 1990
Author(s)
Mark A. Kedzierski, R. L. Webb
… described profiles for this situation have been defined in terms of the fin curvature and arc length. The existing … for commercial manufacture. The fin profiles presented in this paper are conveniently defined by the fin tip radius, … with parameters that are compatible with those used by the manufacturing industry. The heat transfer performance of the …

Protecting Industrial Control Systems - Key Components of our Nation's Critical Infrastructures

August 24, 2011
Author(s)
Shirley M. Radack
… This bulletin summarizes the information presented in NIST Special Publication (SP) 800-82, Guide to Industrial … Recommendations of the National Institute of Standards and Technology. The publication was written by Keith Stouffer and … Control Systems (ICS), information security, information technology (IT) security, programmable logic controllers …

Lumped-Element Impedance Standards

June 1, 1998
Author(s)
Dylan F. Williams, Dave K. Walker
We measure the electrical parameters of commercial lumped-element impedance standards manufactured for the calibration of on-wafer probing systems. The standard's impedance depends not only on the standard itself, but also on probe placement, probe

A Dosimetric Uncertainty Analysis for Photon-Emitting Brachytherapy Sources: Report of the AAPM Task Group No. 138 and GEC-ESTRO

February 1, 2011
Author(s)
Larry A. DeWerd, Geoffrey S. Ibbott, Ali S. Meigooni, Michael G. Mitch, Mark J. Rivard, Kurt E. Stump, Bruce R. Thomadsen, Jack L. Venselaar
… dosimetry. The ISO Guide to the Expression of Uncertainty in Measurement (GUM) and the NIST Technical Note 1297 are … standards for uncertainty formalism. Uncertainties in measuring or estimating brachytherapy dose distributions … to vendors and regulatory agencies in developing good manufacturing practices for sources used in routine clinical …

Procedures for Obtaining NIST Recognition as an Accrediton of Quality System Registrars Under the Fastener Quality Act

December 1, 1998
Author(s)
S. W. Stiefel, R L. Gladhill
… Act (FQA), P.L. 101-592 (the Act). The Act was amended in 1996 by Section 11 of P.L. 104-113. The Act protects the … by: (1) requiring that certain fasteners which are sold in commerce conform to the specifications to which they are … engaged in fastener testing and registration of manufacturing facilities; and (3) requiring inspection, …

Acceptance Testing Methodology for the Production of Standard Reference Material 2806: Medium Test Dust in Hydraulic Fluid

February 24, 2022
Author(s)
Robert A. Fletcher, James J. Filliben, Nicholas Ritchie
… Standard Reference Material (SRM) 2806: Medium Test Dust in Hydraulic Fluid represents a series of reference materials … certified by the National Institute of Standards and Technology (NIST) used to calibrate liquid-borne optical (or automatic) particle counters applied in a wide range of industrial, aerospace, and military …

ASTM E3125 Laser Scanner Standard: Challenges and Role of NIST

July 24, 2018
Author(s)
Prem K. Rachakonda
… Metrology Group (DMG) at National Institute of Standards & Technology (NIST), along with various other organizations were involved in the development of the ASTM E3125-17 documentary standard … committee on 3D imaging systems created a working group in 2013 to standardize the evaluation of instruments such as …

Incorporating Adult Learning Methods and Project Based Learning in Laboratory Metrology Courses

June 15, 2013
Author(s)
Georgia L. Harris
… Measurement scientists work in calibration laboratories throughout the world. Yet, there … equipment and measurement standards. What often happens in the measurement community is that subject matter experts … the past 3 years, the National Institute of Standards and Technology (NIST) Office of Weights and Measures (OWM) - has …

Power Loading Effects in Precision 1 Ohm Resistors

August 1, 2008
Author(s)
George R. Jones, Randolph E. Elmquist
… standards at the National Institute of Standards and Technology (NIST) in the precision potentiometer direct current comparator … to have discrepancies that were not related to the drift in the value of the primary working standards and exceeded … Power Loading Effects in Precision 1 Ohm Resistors …
Displaying 5251 - 5275 of 13218
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