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Displaying 3401 - 3425 of 13216

Standards for computer aided manufacturing:

January 1, 1977
Author(s)
John M Evans, Joseph T O'Neill, John L Little, James S Albus, Anthony J Barbera, Dennis W Fife, Elizabeth N Fong, David E Gilsinn, Frances E Holberton, Brian G Lucas, Gordon E Lyon, Beatrice A S Marron, Albercht J Neumann, Vick V Mabel
… Standards for computer aided manufacturing: …

Standards for computer aided manufacturing:

January 1, 1977
Author(s)
John M Evans, Joseph T O'Neill, John L Little, James S Albus, Anthony J Barbera, Dennis W Fife, Elizabeth N Fong, David E Gilsinn, Frances E Holberton, Brian G Lucas, Gordon E Lyon, Beatrice A S Marron, Albercht J Neumann, Mabel V Vick
… Standards for computer aided manufacturing: …

Standards for computer aided manufacturing:

January 1, 1977
Author(s)
John M Evans, Joseph T O'Neill, John L Little, George E Clark, James S Albus, Anthony J Barbera, Bradford M Smith, Dennis W Fife, Elizabeth N Fong, David E Gilsinn, Frances E Holberton, Brian G Lucas, Gordon E Lyon, Beat Marron
… Standards for computer aided manufacturing: …

Standards for computer aided manufacturing:

January 1, 1977
Author(s)
John M Evans, Joseph T O'Neill, John L Little, James S Albus, Anthony J Barbera, Dennis W Fife, Elizabeth N Fong, David E Gilsinn, Frances E Holberton, Brian G Lucas, Gordon E Lyon, Beatrice A S Marron, Albercht J Neumann, Vick V Mabel
… Standards for computer aided manufacturing: …

Standards for computer aided manufacturing:

January 1, 1977
Author(s)
John M Evans, Joseph T O'Neill, John L Little, James S Albus, Anthony J Barbera, Dennis W Fife, Elizabeth N Fong, David E Gilsinn, Frances E Holberton, Brian G Lucas, Gordon E Lyon, Beatrice A S Marron, Albercht J Neumann, Mabel V Vick
… Standards for computer aided manufacturing: …

Standards for computer aided manufacturing:

January 1, 1976
Author(s)
John M Evans, Joseph T O'Neill, John L Little, James S Albus, Anthony J Barbera, Dennis W Fife, Elizabeth N Fong, David E Gilsinn, Frances E Holberton, Brian G Lucas, Gordon E Lyon, Beatrice A S Marron, Albercht J Neumann, Mabel V Vick
… Standards for computer aided manufacturing: …

Standards for computer aided manufacturing:

January 1, 1976
Author(s)
John M Evans, Joseph T O'Neill, John L Little, James S Albus, Anthony J Barbera, Dennis W Fife, Elizabeth N Fong, David E Gilsinn, Frances E Holberton, Brian G Lucas, Gordon E Lyon, Beatrice A S Marron, Albercht J Neumann, Mabel V Vick
… Standards for computer aided manufacturing: …

Standards for computer aided manufacturing:

January 1, 1976
Author(s)
John M Evans, Joseph T O'Neill, John L Little, James S Albus, Anthony J Barbera, Dennis W Fife, Elizabeth N Fong, David E Gilsinn, Frances E Holberton, Brian G Lucas, Gordon E Lyon, Beatrice A S Marron, Albercht J Neumann, Mabel V Vick
… Standards for computer aided manufacturing: …

Standards for computer aided manufacturing:

January 1, 1976
Author(s)
John M Evans, Joseph T O'Neill, John L Little, James S Albus, Anthony J Barbera, Dennis W Fife, Elizabeth N Fong, David E Gilsinn, Frances E Holberton, Brian G Lucas, Gordon E Lyon, Beatrice A S Marron, Albercht J Neumann, Mabel V Vick
… Standards for computer aided manufacturing: …

Atomic Level Surface Metrology

January 1, 2001
Author(s)
Theodore V. Vorburger, Ronald G. Dixson, Jun-Feng Song, Thomas Brian Renegar, Joseph Fu, Ndubuisi George Orji, V W. Tsai, E. C. Williams, H Edwards, D Cook, P West, R Nyffenegger
… types of optical elementsrequire ultra-smooth surfaces in order to functionas specifiedExamples:Laser gyro mirrors … must be significantly smaller to minimizevariation in the gate oxide … Defense Manufacturing Conference …

iNEMI Project on Automotive Electronic Material Challenges

September 3, 2015
Author(s)
Yaw S. Obeng
… electronics and military grade electronics for use in automotive applications. The drive for miniaturization … at interfaces or other small geometrical structures used in automotive electronics. The opportunity in this project is … have the necessary information to predict reliability of technology to reduce design cycles. This would optimize …
Displaying 3401 - 3425 of 13216
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