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NIST Authors in Bold

Displaying 3301 - 3325 of 13216

Science and technology in America ::an assessment

January 1, 1977
Author(s)
Edward Teller, Norman Ramsey, William O Baker, Henry Eyring, Garrett Birkhoff, Alan Perlis, Robert C Seamans, Simon Ramo
… Science and technology in America ::an assessment …

Quantum Computation, Spectroscopy of Trapped Ions, and Schrodinger Cat

January 1, 1999
Author(s)
David J. Wineland, C Monroe, Wayne M. Itano, D Kielpinski, B E. King, C J. Myatt
… can maximize the quantum-limited signal-to-noise ratio in spectroscopy, is discussed. … Proc. 6^uth^Int. Symp. On Foundations of Quantum Mechanics, in the Light of New Technology … 6^uth^Int. Symp. On Foundations of Quantum Mechanics, in the Light of New Technology …

Photomask Applications of Traceable Atomic Force Microscope Dimensional Metrology at NIST

October 1, 2007
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, James E. Potzick, Joseph Fu, Michael W. Cresswell, Richard A. Allen, S J. Smith, Anthony J. Walton
… The National Institute of Standards and Technology (NIST) has a multifaceted program in AFM dimensional metrology.  Two major instruments are … used for traceable measurements.  The first is a custom in-house metrology AFM, called the calibrated AFM (C-AFM), … Photomask Technology 2007 …

Beyond Color: The New Carbon Ink

May 2, 2021
Author(s)
Ming Zheng, YuHuang Wang
… their various derivative forms, together with the advances in large-scale synthesis, are enabling a whole new generation … autonomous robotics. This review examines recent progress in the reborn field of carbon inks, highlighting their … programmability and multifunctionality for applications in flexible electronics and stimuli-responsive devices. …

NIST Smart Space: Pervasive Computing Initiative

January 1, 2000
Author(s)
Lynne S. Rosenthal, Vincent M. Stanford
… create new opportunities and challenges for Information Technology (IT) companies to place computers and sensors in virtually every device, appliance, and piece of equipment in buildings, homes, workplaces, factories, and even …

NIST Colorimetric Calibration Facility for Displays Colorimeters

January 1, 1999
Author(s)
Steven W. Brown, Yoshihiro Ohno
… been developed at the National Institute of Standards and Technology (NIST) to calibrate color-measuring instruments … Flat Panel Display Technology and Display Metrology, Conference | | | SPIE …

Reliability Characterization of Ultra-Thin Film Dielectrics

December 31, 1998
Author(s)
John S. Suehle
… a critical concern as oxide thickness is scaled below 4 mm in advanced CMOS technologies. Traditional reliability … Conference on Characterization and Metrology for ULSI Technology …

The IEEE TC-10 Standards: Update 2019

February 28, 2020
Author(s)
Nicholas G. Paulter Jr., Sergio Rapuano, Luca De Vito, John R. Jendzurski, W. B. Boyer, S. J. Tilden
… of the performance of these devices, which supports technology and product advancement, product comparison and … well-defined methods to produce reliable data expressed in clear terms. Measurement instruments need to acquire data …

Variable Pressure/Environmental SEM a Powerful Tool for Nanotechnology and Nanomanufacturing

January 1, 2005
Author(s)
Michael T. Postek, Andras Vladar
… success and commercialization of nanotechnology. Advances in fundamental nanoscience, design of new nano-materials, and ultimately manufacturing of new nanoscale products will all depend to a … of nanoscience research have led to remarkable progress in  nanotechnology as well as an evolution of instrumentation …
Displaying 3301 - 3325 of 13216
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