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Search Publications

NIST Authors in Bold

Displaying 3251 - 3275 of 13216

Major International Lead (Pd)-Free Solder Studies

October 16, 2008
Author(s)
C A. Handwerker, E E. de Kluizenaar, K Suganuma, Frank W. Gayle
… Beginning in 1991, the microelectronics community worldwide became … by market pressure, to replace tin-lead eutectic solders in electronic assemblies. Over the ten years that followed, … lead-free assembly to assess lead-free issues, including manufacturing yield, process windows for complex boards, and …

Advances in Production Management Systems: Issues, Trends, and Vision Towards 2030

August 13, 2021
Author(s)
Boonserm Kulvatunyou, David Romero, Gregor V. Cieminski, Paolo Gaiardelli, Ilkyeong Moon, Giuditta Pezzotta, Stefan Wiesner, Marco Macchi, Jannicke B. Hauge, Irene Roda, Daryl Powell, Torbj?rn Netland, Nick Szirbik, Christoph Roser, Erlend Alfnes, Martin Rudberg
… Since its inception in 1978, the IFIP Working Group 5.7 on Advances in Production Management Systems (APMS) has played an active role in the conception, development, and application of innovative … Management, Cyber-Physical Production Systems, Smart Manufacturing, Industry 4.0, Operator 4.0, Product-Service …

Status and Opportunities to Support Product Category Rules in the U.S.

August 12, 2013
Author(s)
Rita Schenck
… hold out the promise of supporting science based decisions in developing, purchasing, and using more environmentally … to produce these labels. There are many standards in place that provide guidance to produce LCAs and EPDs (also … in the BEES software, and a strong program in sustainable manufacturing. NIST can build on these assets to enable the …

Assessment of intra-build variations in tensile strength in electron beam powder-bed fusion Ti-6Al-4V part 1: Effects of build height

June 2, 2022
Author(s)
Nicholas Derimow, Alejandro Romero, Aldo Rubio, Cesar Terrazas, Newell Moser, Orion Kafka, Jake Benzing, Francisco Medina, Ryan Wicker, Nik Hrabe
… In this work, rectangular blocks of electron beam powder-bed … to systematically study the intra-build variations in tensile properties, microstructure, porosity, and … There were no significant contributions to this variation in yield strength (YS) from build location, porosity, grain …

Comparison of Submicron Particle Analysis by Auger Electron Spectroscopy, Time-of-Flight Secondary Ion Mass Spectrometry, and Secondary Electron Microscopy With Energy Dispersive X-Ray Spectroscopy.

July 31, 1996
Author(s)
George W. Mulholland, K D. Childs, D Narum, L A. LaVanier, P M. Lindley, B W. Schueler, A C. Diebold
… Particulate contamination can result in a significant yield loss during semiconductor device … the critical defect size also decreases, resulting in the need to analyze smaller defects. Current manufacturing requirements include analysis of sub-0.5-mum … Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films …

Magnetic Tunnel Junctions with Self-Assembled Molecules

February 5, 2009
Author(s)
Wenyong Wang, Curt A. Richter
… both from fundamental and technological points of view. In this work, such molecular magnetic tunnel junctions are … evidence of the existence of molecular species in the devices. Tunneling spectroscopy are also used to … the spin-polarized inelastic tunneling processes in the molecular device for the first time, and show that …

Integrating planar photonics for multi-beam generation and atomic clock packaging on chip

April 3, 2023
Author(s)
Chad Ropp, Wenqi Zhu, Alexander Yulaev, Daron Westly, Gregory Simelgor, Akash Rakholia, William Lunden, Dan Sheredy, Martin Boyd, Scott Papp, Amit Agrawal, Vladimir Aksyuk
… of integrated photonics and metasurface optics. In this work, we combine these two technologies using … atomic clock. Our planar design includes twelve beams in two co-aligned magneto-optical traps. These beams are …

Quantitative Assessment of Robot-generated Maps

October 8, 2009
Author(s)
Christopher J. Scrapper Jr, Rajmohan Madhavan, Adam S. Jacoff, R Lakaemper, A Censi, Afzal A. Godil, Asim Wagan
… be a sufficiently mature field with demonstrated successes in various domains. While there has been much progress made in the development of computationally efficient and … technologies will improve the utility of mobile robots in already established application areas, such as vacuum …

Ozone Generation from a Germicidal Ultraviolet Lamp with Peak Emission at 222 nm

July 21, 2023
Author(s)
Michael F. Link, Andrew Shore, Behrang Hamadani, Dustin Poppendieck
… Recent interest in commercial devices containing germicidal ultraviolet lamps … human tissue. However, 222 nm light can produce ozone (O3) in air. O3 is an undesirable component of indoor air because … to degrade indoor air quality through oxidation chemistry. In seven four-hour experiments we measured O3 produced from a …

Long-term stability of metal-envelope enclosed ionization gauges

December 1, 2012
Author(s)
James A. Fedchak, Dana R. Defibaugh
… by calibration laboratories and as transfer standards in intercomparisons among metrology laboratories. A … gauges over a 15 year period. All of the gauges included in the study were of the same type: Bayard-Alpert type … repeatedly at the National Institute of Standards and Technology (NIST) using the NIST high-vacuum standard, but …

The NIST Length Scale Interferometer

May 1, 1999
Author(s)
John S. Beers, William B. Penzes
… The National Institute of Standards and Technology (NIST) interferometer for measuring graduated length scales has been in use since 1965. It was developed in response to the redefinition of the meter in 1960 from the … of Research of the National Institute of Standards and Technology …

Solar-Induced Fluorescence Retrievals in the Context of Physiological, Environmental, and Hardware-Based Sources of Uncertainty

May 14, 2019
Author(s)
Julia Marrs, David Allen, Lucy Hutyra
… but is also the source of the largest uncertainties in estimated global carbon budgets. Numerous tower- and … 2017, the Forested Optical Reference for Evaluating Sensor Technology (FOREST) site was established at the National Institute of Standards and Technology (NIST) as a test-bed for SIF instrument …

A Planning Model for Unifying Information Modeling Languages for Product Data Specification (PDES)

January 1, 1990
Author(s)
Joan Tyler
… by advanced computer aided design and computer aided manufacturing (CAD/CAM) ampliation programs. There are many … manufacturing cell to demonstrate how parts are produced in a STEP environment. The manufacturing cell is an integral … PDES Testbed at the National Institute of Standards and Technology (NIST). The Testbed was initiated in 1988 under …

First Results From the Updated NIST/DARPA EUV Reflectometry Facility

July 1, 2002
Author(s)
S Grantham, Charles Tarrio, M B. Squires, Thomas B. Lucatorto
… application of extreme-ultraviolet (EUV) optics is in lithography. A commercial extreme-ultraviolet stepper will … optics, and the largest of these will be tens of cm in diameter. Each of the Mo/Si multilayer stepper mirrors … our group at the National Institute of Standards and Technology (NIST) has implemented several improvements to our …

Fingerprint Vendor Technology Evaluation

January 8, 2015
Author(s)
Craig I. Watson, Gregory P. Fiumara, Elham Tabassi, Su L. Cheng, Patricia A. Flanagan, Wayne J. Salamon
… Fingerprint Vendor Technology Evaluation …

Fingerprint Vendor Technology Evaluation:

December 1, 2014
Author(s)
Craig I. Watson, Gregory P. Fiumara, Elham Tabassi, Wayne J. Salamon, Patricia A. Flanagan
… Fingerprint Vendor Technology Evaluation: …
Displaying 3251 - 3275 of 13216
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