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NIST Authors in Bold

Displaying 2851 - 2875 of 13215

Virtual Surface Calibration Database

January 1, 2004
Author(s)
Thomas B. Renegar, Theodore V. Vorburger, Son H. Bui
… from a web site at the National Institute of Standards and Technology (NIST), USA. Companies, universities, and …

Design and Fabrication of Thin-Film Multijunction Thermal Converters at NIST and Sandia National Laboratories

December 1, 2002
Author(s)
Thomas E. Lipe Jr., Joseph R. Kinard Jr., Thomas F. Wunsch, Ronald R. Manginell
… effort between the National Institute of Standards and Technology and Sandia National Laboratories to design, … thermal converters (MJTCs) based on thin-film technology. These devices are specifically intended for the … Tech. Dig., 2002 Workshop on Nano and Microsystems Technology …

Performance Evaluation and Metrics for Perception in Intelligent Manufacturing

December 31, 2009
Author(s)
Roger D. Eastman, Tsai H. Hong, Jane Shi, Tobias Hanning, Bala Muralikrishnan, S. S. Young, Tommy Chang
… on "Performance Metrics for Perception in Intelligent Manufacturing," held August 20, 2008, brought together … Evaluation and Metrics for Perception in Intelligent Manufacturing …

Integration of vertically-aligned carbon nanotubes with superconducting nanowire single photon detectors

November 27, 2023
Author(s)
Dana Rampini, Chris Yung, Bakhrom Oripov, Solomon I. Woods, John H. Lehman, Sae Woo Nam, Adam McCaughan
… We report on initial fabrication efforts in the integration of superconducting nanowire single-photon … such as spectroscopy, optical communication, and imaging in light starved environments. We developed two fabrication … The membrane style devices showed no degradation in the superconducting properties of the nanowires. …

Calibrated thermal microscopy of the tool-chp interface in machining

January 1, 2003
Author(s)
Matthew A. Davies, Howard W. Yoon, Tony L. Schmitz, Timothy J. Burns, Michael Kennedy
… laboratory at the National Institute of Standards and Technology. The emissivity of the machined material is … Machining Science and Technology … Calibrated thermal microscopy of the tool-chp interface in machining …

Product Modeling Framework and Language for Behavior Evaluation

May 2, 2010
Author(s)
Jae H. Lee, Steven J. Fenves, Conrad E. Bock, Hyo Won Suh, Sudarsan Rachuri, Xenia Fiorentini, Ram D. Sriram
… The semantic-based product modeling language described in this paper is specialized from a web ontology language … semantics of their product models explicitly and logically in an engineering-friendly way. The interactions between … three layers are described to illustrate how each layer in the framework is used in a product engineering context. …

Implementing Grain Traceability Standards: CART and Simulation

February 18, 2020
Author(s)
Frank H. Riddick, Evan K. Wallace, Scott Nieman, Joe Tevis, R. A. Ferreyra
… organizations to develop and standardize traceability technology, focusing on grain traceability, and how modeling, simulation, and analysis technology are being used to support these projects. …

Traceable Calibration of a Critical Dimension Atomic Force Microscope

March 9, 2012
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, Craig D. McGray, John E. Bonevich, Jon C. Geist
… The National Institute of Standards and Technology (NIST) has a multifaceted program in atomic force microscope (AFM) dimensional metrology. One … of this sort are commonly encountered in semiconductor manufacturing and other nanotechnology industries. NIST has …

Industry Case Studies in the Use of Immersive Virtual Assembly

April 1, 2007
Author(s)
Sankar Jayaram, Uma Jayaram, Young J. Kim, Charles Dechenne, Kevin W. Lyons, Craig Palmer, Tatsuki Mitsui
… In this paper we report on two engineering case studies that have been conducted as part of a Virtual Assembly Technology Consortium. The objectives of the case studies … considerable participation from industry engineers and manufacturing shop floor personnel. Based on the success of …

Software Standards Development - Wherever - However - The Bugs are Free

March 1, 2000
Author(s)
Michael D. Hogan
… be more dependent upon the rapid innovation of Information Technology (IT) than the speed of development. In many cases, software standards are burdened with defects, … we may be limited in the future deployment of information technology systems by the defects and complexity of the …

Standards of Seismic Safety for Existing Federally Owned and Leased Buildings

January 1, 2002
Author(s)
Stephen A. Cauffman, Hai S. Lew
… Government by the Interagency Committee on Seismic Safety in Construction (ICSSC) in conjunction with the National Institute of Standards and Technology (NIST) and with the funding support of several … building technology, evaluation, Federal buildings, rehabilitation, …

Workshop Report on Autonomous Methodologies for Accelerating X-ray Measurements

November 5, 2024
Author(s)
Zachary Trautt, Austin McDannald, Brian DeCost, Howard Joress, A. Gilad Kusne, Francesca Tavazza, Tom Blanton
… The National Institute of Standards and Technology and the International Centre for Diffraction Data … structural analysis for materials development and manufacturing. Participants, predominantly from industry, gathered in-person at ICDD headquarters in Newtown Square, …

Standards for the Rapid Prototyping Industry

September 1, 1998
Author(s)
Kevin K. Jurrens
… as facilitate the transition of current advanced rapid manufacturing capabilities from the research laboratory  to … industry workshop at National Institute of Standards and Technology (NIST) (October 1997) form the basis for this …

Measurement of Gate-Oxide Film Thickness by X-ray Photoelectron Spectroscopy

September 1, 2003
Author(s)
Cedric J. Powell, Aleksander Jablonski
… of the correction for elastic-scattering effects in each gate-oxide material. For common measurement … Conference on Characterization and Metrology for ULSI Technology … Proceedings 683, Characterization and Metrology for ULSI Technology: 2003 …

The Art and Science of Lamp Photometry

August 1, 2001
Author(s)
R S. Bergman, Yoshi Ohno
… to characterize lamps. The total luminous flux of lamps (in lumens) is the most important characteristic of lamp … The paper then details recent developments and techniques in integrating sphere photometry that improve the uncertainty … International Symposium on the Science and Technology of Light Sources …

Moment-Preserving Modeling With Image Applications

July 6, 1998
Author(s)
Anastase Nakassis, Abdou S. Youssef
… piece-wise constant modeling is an important special case. In this paper we will develop a piece-wise constant modeling … moments, thus preserving important visual properties in images. The method will be used for two practical image … International Conference on Imaging Science, Systems, and Technology …

The NIST Plan for Providing Public Access to Results of Federally Funded Research

October 2, 2023
Author(s)
Katherine E. Sharpless, Regina L. Avila, Ronald F. Boisvert, A Kirk Dohne, James Fowler, Rachel B. Glenn, Gretchen Greene, Robert Hanisch, Andrea Medina-Smith, Alan Munter, Julie Petrousky, Yuri Ralchenko, Carolyn D. Rowland, James A. St Pierre, Adam Wunderlich, Jon Zhang
… In 2013 White House Office of Science and Technology Policy … In response, he National Institute of Standards and Technology (NIST) developed a public access plan and … Office of Science and Technology Policy, OSTP, open access to research, public …

Software for an Automated Machining Workstation

September 1, 1986
Author(s)
Thomas R. Kramer, Jay S. Jun
… The National Bureau of Standards' Automated Manufacturing Research Facility (AMRF) includes three machining workstations. In the vertical workstation (VWS) metal parts are machined … activity stages and PMOS are handled within a Sun computer in software written in LISP. …

Setting standards and developing technology to aid the human identity testing community

April 1, 2006
Author(s)
John M. Butler, Michael D. Coble, Amy E. Decker, David L. Duewer, Carolyn R. Steffen, Margaret C. Kline, Janette W. Redman, Peter Vallone
… team at the U.S. National Institute of Standards and Technology (NIST) is funded by the National Institute of … Setting standards and developing technology to aid the human identity testing community …
Displaying 2851 - 2875 of 13215
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