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Search Publications

NIST Authors in Bold

Displaying 2526 - 2550 of 13215

CD-SEM Measurement of Line-Edge Roughness Test Patterns for 193-nm Lithography

July 1, 2003
Author(s)
B Bunday, M R. Bishop, John S. Villarrubia, Andras Vladar
… (LER) has recently become a major topic of concern in the litho-metrology community and the semiconductor … as a whole, as addressed in the 2001 International Technology Roadmap for Semiconductors (ITRS) roadmap. The … Companies and from the National Institute of Standards and Technology (NIST) has begun a project to investigate this …

Business Context-Based Approach for Managing the Digitalization of Biopharmaceutical Supply Chain Operational Requirements

September 14, 2023
Author(s)
Elena Jelisic, Milos Drobnjakovic, Boonserm Kulvatunyou, Nenad Ivezic, Hakju Oh
… has brought to attention several supply chain challenges in the globalized biopharmaceutical industry. Demand … fluctuations and the ability to effectively repurpose manufacturing facilities, and to dynamically adapt scheduling … While the manufacturing of final products is concentrated in a few western locations, raw materials may come from other …

Structural Characterization of Methylsilsequioxane-Based Porous Low-k Thin Films Using X-Ray Porosimetry

June 1, 2003
Author(s)
Hae-Jeong Lee, Christopher L. Soles, Da-Wei Liu, Barry J. Bauer, Eric K. Lin, Wen-Li Wu
… pore size with the largest population range from 10 to 15 in radius. The wall density is independent of the porogen … content and it appears that some of the porogen remains in the wall material. These results are compared to … Proceedings of the IEEE International Interconnect Technology Conference …

Beyond WEBCAM: A Site-Web-Site for Building Construction.

September 23, 2002
Author(s)
S Nuntasunti, L E. Bernold
… robotics, building construction, technology utilization, equipment, safety, communication … International Symposium on Automation and Robotics in Construction, 19th (ISARC). Proceedings. National Institute of Standards and Technology …

The Biometric Consortium 2000 Conference Proceedings

September 11, 2000
Author(s)
Fernando L. Podio, J S. Dunn
… Consortium 2000 Conference examined rapid advances in biometric technologies and applications and explored new developments in the areas of metrology, assurance, and standards. Biometrics integration with information technology products was also addressed. The Conference …

Introduction to the Special Issue

May 1, 2015
Author(s)
Thomas M. Wallis, Goutam Chattopadhyay, Fabio Cocetti, Luca Pierantoni
… In the inaugural editorial of these IEEE Transactions on Terahertz Science and Technology – September 2011, the editor-in-chief anticipated … the fact that the unifying theme of terahertz science and technology intersects with a wide and diverse set of … IEEE Transactions on Terahertz Science and Technology …

Effects of Powder Oxidation on Impact Toughness of Electron Beam Melt Ti-6Al-4V

August 25, 2017
Author(s)
Edward J. Garboczi, Enrico Lucon, William Grell, Z Loftus, Maciej Kumosa, E Solis-Ramos, Paul Predecki, E Clark
… Powder quality in additive manufacturing (AM) electron beam melt (EBM) of Ti-6Al-4V components is crucial in determining the critical material properties of the end … Additive Manufacturing, Ti-6Al-4V Powder, EBM, Oxidation, Charpy …

Telecom band quantum dot technologies for long-distance quantum networks

December 4, 2023
Author(s)
Ying Yu, Changmin Lee, Peter Michler, Stephan Reitzenstein, Kartik Srinivasan, Edo Waks, Shunfa Liu, Jin Liu
… the low-loss optical fibre network and the established technologies of modern optical communications. Semiconductor … Telecom band quantum dot technologies for long-distance quantum networks …

Speed, the double edge sword of the Industry 4.0

October 31, 2022
Author(s)
Marion Toussaint, Sylvere Krima, Allison Barnard Feeney, Herve Panetto
… The recent digital transformation of the manufacturing world led to numerous benefits, from higher … to increased productivity and reduced time to market. In this digital world, data has become a critical element in many essential decisions and processes within and across …

Incoporating Process Planning into Conceptual Design

September 1, 1999
Author(s)
Shaw C. Feng, Gordon A. Shaw, Walter W. Nederbragt, Serge Kaing, Ram D. Sriram
… This paper describes recent developments in the Design and Process Planning Integration (DPPI) project at the National Institute of Standards and Technology (NIST). The project addresses the need for … planning in the early product design stage. Since major manufacturing costs are committed during product …

System Requirements Analysis for the U.S. Army Rock Island Arsenal Tool Management System

March 1, 1990
Author(s)
Simon P. Frechette, Charles R. McLean
… The U.S. Army is conducting an extensive manufacturing modernization program at the Rock Island Arsenal (RIA) in Illinois. Tool management, as it applies to these … Island Arsenal and the National Institute of Standards and Technology (NIST) recognize that a consistent and integrated …

Quality Focus: Certified Reference Materials

June 1, 2010
Author(s)
Katherine E. Sharpless
… In June of this year, the final stage of the staggered implementation of current Good Manufacturing Practices (cGMPs) took effect, requiring all … with its rules. The National Institute of Standards and Technology (NIST) is working with the National Institutes of …
Displaying 2526 - 2550 of 13215
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