Podio, F.
and Dunn, J.
(2000),
The Biometric Consortium 2000 Conference Proceedings, - 6724, National Institute of Standards and Technology, Gaithersburg, MD
(Accessed December 2, 2024)
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The Biometric Consortium 2000 Conference Proceedings
Published
Author(s)
, J S. Dunn
Abstract
The Biometric Consortium 2000 Conference examined rapid advances in biometric technologies and applications and explored new developments in the areas of metrology, assurance, and standards. Biometrics integration with information technology products was also addressed. The Conference proceedings include presentations on a series of topics addressing biometric applications, Government programs and initiatives, research and future technologies, business cases, emerging standards, metrology and biometric assurance.Citation
- 6724
Report Number
6724
Pub Type
NIST Pubs
Keywords
biometric assurance, biometric authentication, Biometric Consortium, biometric research, biometric standards, biometric technologies, biometrics, electronic signature, protection profiles
Citation
Issues
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Created September 11, 2000, Updated June 28, 2012