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Displaying 13501 - 13525 of 17285

Measurement and Control Based on a Common Sense of Time using IEEE 1588

January 1, 2003
Author(s)
Kang B. Lee
Distributed measurement and control systems in which all components share a common sense of time allow significant decoupling of synchronization issues from considerations of communication latency and fluctuation. This decoupling enables new techniques for

From Model to Markup: XML Representation of Product Data

December 1, 2002
Author(s)
Joshua Lubell
Business-to-consumer and business-to-business applications based on the Extensible Markup Language (XML) tend to lack a rigorous description of product data, the information generated about a product during its design, manufacture, use, maintenance, and

A Monolithic Implementation of Interface Circuitry for CMOS Compatible Gas-Sensor System

July 1, 2002
Author(s)
Muhammad Afridi, John S. Suehle, Mona E. Zaghloul, David W. Berning, Allen R. Hefner Jr., Stephen Semancik, Richard E. Cavicchi
A monolithic CMOS micro-gas-sensor system, designed and fabricated in a standard CMOS process, is described. The gas-sensor system incorporates an array of four microhotplate-based gas-sensing structures. The system utilizes a thin film of tin-oxide (SnO 2

Near-Optimal Parameter for Tikhonov and Other Regularization Methods

December 1, 2001
Author(s)
Dianne M. O'Leary
Choosing the regularization parameter for an ill-posed problem is an art based on good heuristics and prior knowledge of the noise in the observations. In this work we propose choosing the parameter, without a priori information, by approximately

First Workshop on Wireless Sensing

June 4, 2001
Author(s)
Kang B. Lee, James D. Gilsinn, Richard D. Schneeman, Hui-Min Huang
… Center in Chicago, IL. The National Institute of Standards and Technology (NIST), SENSORS magazine, Sensors …

Small-Angle Neutron Scattering Measurements of Nanoscale Lithographic Features

December 1, 2000
Author(s)
Wen-Li Wu, Eric K. Lin, Q Lin, M Angelopoulos
The continuing decrease in feature sizes in the semiconductor and other nanofabriation industries has placed increasingly stringent demands on current microscopy-based techniques to precisely measure both the critical dimensions and the quality (i.e. line

The Representation of Function in Computer-Based Design

September 1, 1999
Author(s)
Simon Sykman, Ram D. Sriram, J Racz
This paper proposes a standardized representation of function for use by the research community, industry, and eventually commercial software vendors. This includes schemata (information models) for representation of function and associated flows, as well

Modified Field Studies for CSCW Systems

January 1, 1999
Author(s)
Michelle P. Steves, Jean C. Scholtz
… We, at the National Institute of Standards and Technology (NIST), are in the process of …

Class D Fire Suppression Experiments.

July 1, 1998
Author(s)
R L. Vettori
To investigate the effectiveness of water based extinguishing agents on non alkali Class D fires, two series of fire suppression experiments were conducted. The first experimental series was conducted by Underwriters Laboratory at the facility located in
Displaying 13501 - 13525 of 17285
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