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NIST Authors in Bold

Displaying 876 - 900 of 17262

A Capacitance Standard Based on Counting Electrons

September 1, 1999
Author(s)
Mark W. Keller, A P. Chen, John M. Martinis, Neil M. Zimmerman
… A capacitance standard based directly on the definition of capacitance was … capacitance standard, single electron tunneling … A Capacitance Standard Based on Counting Electrons …

Multi-Enterprise Concurrent Engineering Through International Standards

October 1, 1991
Author(s)
Gary Carver, Howard Bloom
… computer systems. Critical enablers are product data standards and enterprise integration frameworks. A pioneering … of Product model data (STEP). Surpassing in scope previous standards efforts, the goal is a complete, unambiguous, … integrated levels of automation based upon information standards and frameworks. Concurrent engineering, through …

STANDARD LEDS WITH SUPERIOR LONG-TERM STABILITY

April 22, 2021
Author(s)
Yuqin Zong, Weiqiang Zhao, C Cameron Miller
… A large-chip standard LED with superior long-term stability have been developed at NIST. The standard LED uses a large, specialty die rated for 50 W but is operated under 3 W to eliminate aging effect. The standard LED was seasoned for one year and measured for its …

Personal Identity Verification (PIV) of Federal Employees and Contractors

September 4, 2013
Author(s)
National Institute of Standards and Technology (NIST), Hildegard Ferraiolo, David Cooper, Salvatore Francomacaro, Ketan Mehta, Annie W. Sokol
… National Institute of Standards and Technology (NIST), Hildegard Ferraiolo , David … credential, cryptography, Federal Information Processing Standards (FIPS), HSPD-12, identification, identity, …

Maintenance Testing for the Data Encryption Standard

August 1, 1980
Author(s)
Jason Gait
… for the Federal Information Processing Data Encryption Standard (DES) . The tests consist of an iterative procedure … security, computer security, cryptography, data encryption standard, in-service testing, maintenance tests, Monte-Carlo … Maintenance Testing for the Data Encryption Standard

Frequency Measurements of Al+ and Hg+ Optical Standards

June 8, 2009
Author(s)
Wayne M. Itano, James C. Bergquist, Till P. Rosenband, David J. Wineland, David Hume, Chin-wen Chou, Steven R. Jefferts, Thomas P. Heavner, Tom Parker, Scott Diddams, Tara Fortier
… Frequency standards based on narrow optical transitions in 27Al+ and 199Hg+ ions have been developed at NIST. Both standards have absolute reproducibilities of a few parts in … combs makes it possible to compare the optical frequency standards to microwave frequency standards or to each other. …

Standard Platinum Resistance Thermometer Calibrations from the Ar TP to the Ag FP

December 19, 2007
Author(s)
Gregory F. Strouse
… the international Scale of 1990 (ITS-90). The Standard Platinum Resistance Thermometer (SPRT) Calibration … cells, International Temperature Scale of 1990, ITS-90, Standard Platinum Resistance Thermometer, SPRT, SPRT Cal. … Standard Platinum Resistance Thermometer Calibrations from …

A STANDARD ANALYSIS APPROACH TO DETERMINE PRODUCT APPLICABILITY

August 31, 2011
Author(s)
Paul W. Witherell, Prabir Sarkar, Anantha Narayanan Narayanan, Jae H. Lee, Sudarsan Rachuri
… actions in business processes that will lead to additional standard compliance. … standard analysis, Zachman framework, gaps and overlaps, … A STANDARD ANALYSIS APPROACH TO DETERMINE PRODUCT APPLICABILITY …

Deployment of a Compact, Transportable, Fully Automated Josephson Voltage Standard

April 1, 1999
Author(s)
Stuward L. Kupferman, Clark A. Hamilton
… A compact, transportable, Josephson voltage standard, first reported at CPEM96, has now been field tested and has had ten months of use as a primary standard by National Aeronautics and Space Administration … training, and the experience of users. A second similar standard with an improved microwave system has been …

New NIST Photomask Linewidth Standard

December 1, 2002
Author(s)
James E. Potzick, J Pedulla, Michael T. Stocker
… stable. Any replacement or duplicate NIST linewidth standard will be traceable to this same reference, and thus traceable to any other NIST length standard. Such measurement traceability can be achieved only … between the definition of the meter and the NIST linewidth standard.This process results in a confidence interval about …

A Method for the Preparation of NIST Traceable Fossil Fuel Standards with Concentrations Intermediate to SRM Values

August 1, 2012
Author(s)
William R. Kelly, Bruce S. MacDonald, John L. Molloy, Stefan D. Leigh, Andrew L. Rukhin
… and thereby produce in their laboratory fossil fuel standards for selected elements of almost any desired … to assist analysts through the entire process of producing standards of intermediate concentrations from existing fossil … fossil fuels, reference materials, standards, blending, Designer method, Interval-repeatability …

ASTM E3125 Laser Scanner Standard: Challenges and Role of NIST

July 24, 2018
Author(s)
Prem K. Rachakonda
… in the development of the ASTM E3125-17 documentary standard for 3D imaging systems. The ASTM E57 committee on 3D … the effort and was a major contributor in developing this standard within the ASTM framework. The members of this … experts. This working group released the ASTM E3125-17 standard in 2017. Over 20 publications were published by DMG …

The Role of Standards in Product Lifecycle Management Support

January 1, 2006
Author(s)
Eswaran Subrahmanian, Sudarsan Rachuri, A Bouras, Steven J. Fenves, Sebti Foufou, Ram D. Sriram
… of computer systems and people through well defined standards. We begin this paper with a model of communication … so as to serve as the basis for understanding the role of standards for PLM support systems. Support of PLM requires a set of complementary and interoperable standards that cover the various aspects of PLM. We identify …

Biometric Standards -- A Key to a More Secure World

March 1, 2003
Author(s)
Michael D. Hogan, Fernando L. Podio
… months, the U.S has quickly worked to establish formal standards groups for accelerating and harmonizing the development of national and international biometric standards of high relevance to the U.S. The work of these new … the InterNational Committee for Information Technology Standards (INCITS) Technical Committee M1 on Biometrics and …

Settling Times of High-Value Standard Resistors

June 1, 2004
Author(s)
Dean G. Jarrett, Randolph Elmquist
… fabrication, measurement, settling time, standard resistor, uncertainty … Settling Times of High-Value Standard Resistors …

Suppression of Engine Nacelle Fires (NIST SP 890)

November 1, 1995
Author(s)
Anthony P. Hamins, Thomas G. Cleary, P. Borthwick, N Gorchkov, Kevin B. McGrattan, Glenn P. Forney, William L. Grosshandler, Cary Presser, L Melton
… Special Publication (NIST SP) - 890 … Suppression of Engine Nacelle Fires (NIST SP 890) …

Fluid Dynamics of Agent Discharge (NIST SP 861)

April 1, 1994
Author(s)
William M. Pitts, Jiann C. Yang, G. Gmurczyk, Leonard Y. Cooper, William L. Grosshandler, W G. Cleveland, Cary Presser
… Special Publication (NIST SP) - 861 … Fluid Dynamics of Agent Discharge (NIST SP 861) …
Displaying 876 - 900 of 17262
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