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Search Publications

NIST Authors in Bold

Displaying 4001 - 4025 of 17264

Accuracy Considerations for Critical Dimension Semiconductor Metrology

September 9, 2008
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, B Bunday, J Allgair
… be overemphasized. In response, the National Institute of Standards and Technology (NIST) in conjunction with SEMATECH … Instrumentation, Metrology, and Standards for Nanomanufacturing II Proceedings of SPIE Volume …

Towards a standards-based methodology for extending manufacturing process models for sustainability assessment

June 18, 2018
Author(s)
Karl Haapala, Arvind Shankar Raman, KC Morris
… perspective. In addition, frameworks, methodologies, and standards development for characterizing and linking unit … research efforts are first briefly reviewed, and then ASTM standards derived from this work are described and built … model. The methodology developed is based on the ASTM standards of characterizing manufacturing process for …

Development of a Seebeck Coefficient Standard Reference Material

August 7, 2009
Author(s)
Nathan Lowhorn, Winnie Wong-Ng, John Lu, Evan L. Thomas, Makoto Otani, Martin L. Green, Neil Dilley, Jeffrey Sharp, Thanh N. Tran
… We have successfully developed a Seebeck coefficient Standard Reference Material (SRM ), Bi2Te3, that is crucial … Development of a Seebeck Coefficient Standard Reference Material …

Cryptographic Protection for the Twenty-First Century

March 1, 2001
Author(s)
Elaine B. Barker
… In 2000, the National Institute of Standards and Technology (NIST) announced the selection of a … AES will not be used alone, but as part of a cryptographic standards toolkit of algorithms and protocols to provide …

Analysis of ISCD-NIST Survey for Bone Health

April 1, 2009
Author(s)
Andrew M. Dienstfrey, Tammy L. Oreskovic, Herbert S. Bennett, Lawrence T. Hudson
… In 2007, the National Institute of Standards and Technology and the International Society for … for Clinical Densitometry (ISCD), National Institute of Standards and Technology (NIST), region of interest (ROI), reference database, standards, survey analysis …

A network of cooler white dwarfs as infrared standards for flux calibration

October 1, 2024
Author(s)
Abbigail Elms, Nicola Gentile Fusillo, Pier-Emmanuel Tremblay, ralph bohlin, Mark Hollands, Snehalata Sahu, Mairi O'Brien, Susana Deustua, Tim Cunningham
… cosmology because absolute flux uncertainties of stellar standards propagate into scientific results. With the ever … with &#55349;eff < 20 000K as spectrophotometric flux standards that are equally, if not more, accurate at IR … A network of cooler white dwarfs as infrared standards for flux calibration …

Advancing Measurement Science for Microelectronics: CHIPS R&D Metrology Program

February 13, 2024
Author(s)
Marla L. Dowell, Hannah Brown, Gretchen Greene, Paul D. Hale, Brian Hoskins, Sarah Hughes, Bob R. Keller, R Joseph Kline, June W. Lau, Jeff Shainline
… NIST is leveraging its measurement science expertise, standards development contributions, and stakeholder … Metrology, semiconductor, microelectronics, materials, standards, manufacturing …

Color Measurements for Pearlescent Coatings

February 1, 2004
Author(s)
Maria E. Nadal, E A. Early
… recent developments at the National Institution of Standards and Technology in the colorimetric characterization … color, gonioapparent coatings, reflectance colorimetry, standards …

Temperature Metrology and Its Impact on Industry

September 1, 2003
Author(s)
Hratch G. Semerjian, Ellyn S. Beary
… measurement tools that are traceable to national standards, improve process design, enhance process yields, … global standards, metrology, temperature measurements, traceability …

Certification of Standard Reference MaterialA(R) 955d, Toxic Elements and Metabolites in Frozen Human Blood:

October 1, 2020
Author(s)
L.L. Yu, G.C. Caceres, S.E. Long, K.E. Murphy, C.E. Bryan Sallee, T.W. Vetter, C. Hagwood, M.A. Franklin, J. Castro Georgi, J.M. Jarrett, D.M. Jones, R.L. Jones, Z. Li, Y.L. Sommer, D.S. Tevis, K. Wallon, C.D. Ward, M. Maras, S. Erdahl, C. Gilmer, M. Wermers, H. Woldeysus, K.F. Mehigan, M. Morrissette, C.D. Palmer, P.J. Parsons
… Certification of Standard Reference MaterialA(R) 955d, Toxic Elements and …
Displaying 4001 - 4025 of 17264
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