NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Development of a Seebeck Coefficient Standard Reference Material
Published
Author(s)
Nathan Lowhorn, Winnie Wong-Ng, John Lu, Evan L. Thomas, Makoto Otani, Martin L. Green, Neil Dilley, Jeffrey Sharp, Thanh N. Tran
Abstract
We have successfully developed a Seebeck coefficient Standard Reference Material (SRM ), Bi2Te3, that is crucial for interlaboratory data comparison and for instrument calibration. Certification measurements were performed using two different techniques on 10 samples randomly selected from a batch of 390 bars. The certified Seebeck coefficient values are provided from 10K to 390K. The availability of this SRM will validate the measurement accuracy, leading to a better understanding of the structure/property relationships and the underlying physics of novel and improved thermoelectric materials. An overview of the measurement techniques and data analysis of this new SRM is given.
Lowhorn, N.
, Wong-Ng, W.
, Lu, J.
, Thomas, E.
, Otani, M.
, Green, M.
, Dilley, N.
, Sharp, J.
and Tran, T.
(2009),
Development of a Seebeck Coefficient Standard Reference Material, Applied Physics A-Materials Science & Processing, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854458
(Accessed October 6, 2025)