Lowhorn, N.
, Wong-Ng, W.
, Lu, J.
, Thomas, E.
, Otani, M.
, Green, M.
, Dilley, N.
, Sharp, J.
and Tran, T.
(2009),
Development of a Seebeck Coefficient Standard Reference Material, Applied Physics A-Materials Science & Processing, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854458
(Accessed April 25, 2024)
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Development of a Seebeck Coefficient Standard Reference Material
Published
Author(s)
, , , , , , Neil Dilley, Jeffrey Sharp, Thanh N. Tran
Abstract
We have successfully developed a Seebeck coefficient Standard Reference Material (SRM ), Bi2Te3, that is crucial for interlaboratory data comparison and for instrument calibration. Certification measurements were performed using two different techniques on 10 samples randomly selected from a batch of 390 bars. The certified Seebeck coefficient values are provided from 10K to 390K. The availability of this SRM will validate the measurement accuracy, leading to a better understanding of the structure/property relationships and the underlying physics of novel and improved thermoelectric materials. An overview of the measurement techniques and data analysis of this new SRM is given.Citation
Applied Physics A-Materials Science & Processing
Volume
96
Issue
2
Pub Type
Journals
Download Paper
Keywords
NIST Seebeck Coefficient SRM , Bi2Te3, certification, metrology, thermoelectric materials
Citation
Created August 6, 2009, Updated October 12, 2021