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Search Publications

NIST Authors in Bold

Displaying 3501 - 3525 of 17263

Nanoscale Contacts Form the Bridge for Nano-Electrotechnical Businesses

August 3, 2009
Author(s)
Herbert S. Bennett
… may follow to establish international standards with the goal of accelerating innovation in … examples of metrology tools that require improved standards for assessing the performance and reliability of … "Standards", "Measurements", "Nanoscale", "Electrical …

NIST Data Gateway

October 16, 2008
Author(s)
D M. Blakeslee, Angela Y. Lee, A J. Belsky, John E. Fuller III
The NIST Data Gateway is a web portal that provides easy access to NIST Standard Reference Data, which cover a broad range of substances and properties from many different scientific disciplines. Users can search for specific keywords, properties, and

Improved Nozzle Manifold for Gas Flow Calibrations

June 20, 2012
Author(s)
Aaron N. Johnson, Chunhui Li, John D. Wright, Gina M. Kline, Christopher J. Crowley
… recently improved 677 L PVTt standard. The CFV working standards are used in parallel to calibrate customer flow … metrological equivalence of NIST’s 677 L and 26 m3 PVTt standards. …

Handheld Real-Time PCR Device

January 26, 2016
Author(s)
Christian D. Ahrberg, Robert Ilic, Andreas Manz, Pavel Neu?il
Here we report one of the smallest real-time PCR system up to date with approximate size of 100 mm × 60 mm × 33 mm. The system is an autonomous unit requiring an external 12 V power supply. Four simultaneous reactions are performed in form of virtual

TEM Calibration Methods for Critical Dimension Standards

April 5, 2007
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, B Bunday, M R. Bishop, Michael W. Cresswell, J Allgair
… dimension (CD) metrology is finding suitable calibration standards. Over the last few years there has been some … with transmission electron microscope (TEM) as primary standards for linewidth measurements.  This is because some … spacing images produced by TEM has been used as a primary standards is in critical dimension atomic force microscopes …

The Latest and Greatest NIST PCR-based DNA Profiling Standard: Updates and Status of Candidate Standard Reference Material (SRM) 2391c

November 1, 2011
Author(s)
Margaret C. Kline, Carolyn R. Steffen, Jamie L. Almeida, Erica L. Romsos, Michael D. Coble, John M. Butler
… Standard Reference Material 2391c (SRM 2391c) PCR-based DNA Profiling Standard is the third renewal of this SRM, originally … The Latest and Greatest NIST PCR-based DNA Profiling Standard: Updates and Status of Candidate Standard Reference Material (SRM) 2391c …

NIST Cloud Computing Forensic Reference Architecture

July 30, 2024
Author(s)
Martin Herman, Michaela Iorga, Ahsen Michael Salim, Robert H. Jackson, Mark R. Hurst, Ross A. Leo, Anand Kumar Mishra, Nancy M. Landreville, Yien Wang
… Special Publication (NIST SP) - 800-201 …

Guide to Operational Technology (OT) Security

September 28, 2023
Author(s)
Keith A. Stouffer, Michael Pease, CheeYee Tang, Timothy Zimmerman, Victoria Yan Pillitteri, Suzanne Lightman, Adam Hahn, Stephanie Saravia, Aslam Sherule, Michael Thompson
… Special Publication (NIST SP) - 800-82r3 …
Displaying 3501 - 3525 of 17263
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