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Displaying 1926 - 1950 of 4197

Environmental Regulations Impose New Product Lifecycle Information Requirements

July 1, 2007
Author(s)
John V. Messina, Eric D. Simmon, Matthew L. Aronoff
… governments enacting legislation to encourage sustainable manufacturing where industry creates products that minimize … seeks to shift the environmental responsibility of product manufacturing to the finished goods manufacturer. To meet … total energy used during a products lifecycle, including manufacturing and transportation energy. New systems must be …

Visualizing Model-based Product Definitions in Augmented Reality

August 23, 2021
Author(s)
Teodor Vernica, Robert R. Lipman, William Z. Bernstein
… technologies present immense potential for the design and manufacturing communities. However, coordinating traditional … A major barrier is the lack of interoperability between manufacturing-specific data models and AR-capable data … we present a pipeline for porting standards-based product manufacturing information (PMI) with three-dimensional (3D) …

Leveraging standard geospatial representations for industrial augmented reality

May 1, 2020
Author(s)
Teodor I. Vernica, Aaron M. Hanke, William Z. Bernstein
… a recent surge in adoption and integration within the manufacturing enterprise. While industrial AR has been … case that allows for remote monitoring and inspection of manufacturing systems by overlaying contextual information, … such as machine execution data, over the video feed of the manufacturing floor. Additionally, we discuss challenges …

Dimensional Review of Scales for Forensic Photography

November 25, 2015
Author(s)
Massimiliano Ferrucci, Theodore D. Doiron, Robert M. Thompson, John Jones, Adam J. Freeman, Janice A. Neiman
… available scales exposes a lack of consistency in manufacturing processes and, consequently a lack of strict … quality of commercially available photo scales, document manufacturing processes, and suggest pathways for establishing manufacturing standards for forensic photo scales that will …

Report of the 95th National Conference on Weights and Measures

June 10, 2011
Author(s)
Linda D. Crown, Tina G. Butcher, Steven E. Cook, Lisa Warfield, David A. Sefcik
The 95th Annual Meeting of the National Conference on Weights and Measures (NCWM) was held July 11 to 15, 2010, at the Crowne Plaza St. Paul Riverfront, St. Paul, Minnesota. The theme of the meeting was “Breaking Molds to Shape the Future.” Reports by the

Report of the 88th National Conference on Weights and Measures

December 9, 2003
Author(s)
Linda D. Crown, K M. Dresser, Steven E. Cook, Juana S. Williams, R C. Suiter, L T. Sebring, H V. Oppermann
The 88th Annual Meeting of the National Conference on Weights and Measures (NCWM) was held July 13 through 17, 2003, at the John Ascuaga s Nugget Hotel in Sparks, NV. The theme of the meeting was, Moving Strategically into the Future. Reports by the NCWM

Report of the 87th National Conference on Weights and Measures

December 1, 2002
Author(s)
H V. Oppermann, T L. Grimes
The 87th Annual Meeting of the National Conference on Weights & Measures (NCWM) was held July 14 through July 18, 2002, at the Omni Netherland Holtel, Cincinnati, OH. The theme of the meeting was A Progressive Partnership for the Future--You and NCWM

Reliability Metrology for the Semiconductor Industry at NIST

April 10, 2004
Author(s)
Stephen Knight, John S. Suehle, Joaquin (. Martinez
… critical metrology development for the semiconductor manufacturing industry as it moves from the microelectronics … Metrology Program, a program assisting the semiconductor manufacturing industry and its supporting infrastructure …

Helping Robots Stay on Target

December 2, 2019
Author(s)
Elena R. Messina, Jeremy Marvel
… that influence the robot's ability to meet a manufacturing process's needs. Generally, a robot's …

Cellulose Nanocrystals the Next Big Nano-thing?

August 6, 2008
Author(s)
Michael T. Postek, Andras Vladar, John A. Dagata, Natalia Farkas, Bin Ming, Ronald Sabo, Theodore H. Wegner
… to be utilized in an array of future materials once the manufacturing processes and nanometrology are fully … impact the U.S. economy. The basic processes common to manufacturing qualification of raw materials, continuous … other nanomaterials, at least, cellulose nanocrystal manufacturing is already a sustainable and viable bulk …

Test Structure Fundamentals

April 4, 2011
Author(s)
Richard Allen
Test structures are critical tools for semiconductor manufacturers, allowing for understanding of the process and individual circuit elements that cannot be acquired from measurements of the circuits, which can have billions of transistors and other
Displaying 1926 - 1950 of 4197
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