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Displaying 3451 - 3475 of 4199

Quantitative Assessment of Robot-generated Maps

October 8, 2009
Author(s)
Christopher J. Scrapper Jr, Rajmohan Madhavan, Adam S. Jacoff, R Lakaemper, A Censi, Afzal A. Godil, Asim Wagan
Mobile robotic mapping is now considered to be a sufficiently mature field with demonstrated successes in various domains. While there has been much progress made in the development of computationally efficient and consistent mapping schemes, it is still

Dietary Supplement Standard Reference Materials

October 1, 2009
Author(s)
Lane C. Sander, Karen W. Phinney, Michele M. Schantz, Katherine E. Sharpless, Stephen A. Wise
… materials are needed to promote quality and consistency in manufacturing, and accuracy in product labeling. Reference …

MATERIALS SCIENCE: Nanoscale Polymer Processing

October 31, 2008
Author(s)
Christopher L. Soles, Yifu Ding
Plastics are ubiquitous in our modern world. It difficult to find a manufactured object that does not contain at least some sort polymeric (plastic) components. This ubiquity, in large part, reflects the ease with which polymers can be formed at low

Major International Lead (Pd)-Free Solder Studies

October 16, 2008
Author(s)
C A. Handwerker, E E. de Kluizenaar, K Suganuma, Frank W. Gayle
… lead-free assembly to assess lead-free issues, including manufacturing yield, process windows for complex boards, and …

Sustaining Engineering Informatics: Toward Methods and Metrics for Digital Curation

July 1, 2008
Author(s)
Joshua Lubell, Sudarsan Rachuri, Eswaran Subrahmanian, Mahesh Mani
Ensuring the long-term usability of engineering informatics (EI) artifacts is a challenge, particularly for products with longer life cycles than the computing hardware and software used for their design and manufacture. Addressing this challenge requires

Contact-induced crystallinity for high-performance soluble acene-based transistors and circuits

March 8, 2008
Author(s)
David J. Gundlach, James E. Royer, SK Park, Sankar Subramanian, Oana Jurchescu, Behrang H. Hamadani, Andrew Moad, Regis J. Kline, LC Teague, Oleg A. Kirillov, Curt A. Richter, Lee J. Richter, Sean R. Parkin, Thomas Jackson, JE Anthony
… Commercialization of this technology requires reduction in manufacturing costs by exploiting inexpensive low-temperature …

Contact Induced Crystallinity for High Performance Soluble Acene-Based TFTs

February 17, 2008
Author(s)
David J. Gundlach, James Royer, Behrang Hamadani, Lucile C. Teague, Andrew J. Moad, Oana Jurchescu, Oleg A. Kirillov, Lee J. Richter, James G. Kushmerick, Curt A. Richter, Sungkyu Park, Thomas Jackson, Sankar Subramanian, John E. Anthony
… limits the potential for the significant reductions to manufacturing costs which are viewed as critical to …

Laser Tracker Testing at NIST Using the ASME B89.4.19 Standard

January 1, 2007
Author(s)
Balasubramanian Muralikrishnan, Christopher J. Blackburn, Daniel S. Sawyer, Bruce R. Borchardt, William T. Estler, Steven D. Phillips
While the versatility and economics of laser trackers are quite appealing, the ability to assess their accuracy and to compare various brands has been limited by a lack of a national or international standard that encompasses testing and traceability

Implementing Electronic Materials Data Exchange

August 18, 2005
Author(s)
Eric D. Simmon, Arthur Griesser
Adding automation to your materials declaration process will set, simplify, and streamline the materials declaration process. Whether your company is a component supplier, board manufacturer or assembly services company, the structure of how you manage

Evaluation of Thermal Imaging Cameras Used in Fire Fighting Applications

August 1, 2004
Author(s)
Francine K. Amon, Anthony P. Hamins
Thermal imaging cameras are rapidly becoming integral equipment for first responders for use in burning structures. Currently there are no standardized test methods or performance metrics available to the users or manufacturers of these instruments. The

Building Integrated Photovoltaic Test Facility

August 1, 2001
Author(s)
Arthur H. Fanney, Brian P. Dougherty
… as a result of the continuing decline in photovoltaic manufacturing costs, the relative ease in which photovoltaics …

Noncontact Thermometry in the Optical Technology Division at NIST

March 1, 2001
Author(s)
Charles E. Gibson, Howard W. Yoon, Benjamin K. Tsai, Bettye C. Johnson, Robert D. Saunders
The Optical Technology Division (OTD) at the National Institute of Standards and Technology (NIST) maintains the thermodynamic temperature scale above the silver freezing point using spectral radiance ratios according to the International Temperature Scale
Displaying 3451 - 3475 of 4199
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