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Bibliography of the NIST Optoelectronics Division

September 1, 1999
Author(s)
Amy Smith, Gordon W. Day
The National Institute of Standards and Technology's (NIST's) Optoelectronics Division was established in 1994 to provide the optoelectronics industry with measurement technology, standards, and traceability to those standards. Optoelectronics research at

RTP Calibration Wafer Using Thin-Film Thermocouples

April 1, 1998
Author(s)
Kenneth G. Kreider, D P. DeWitt, Benjamin K. Tsai, Francis J. Lovas, David W. Allen
… is a key technology for the cluster tool, single wafer manufacturing approach that is used to produce integrated … hindered the widespread use of RTP in semiconductor device manufacturing. The current technology for calibrating the …

An update on dose calibrator settings for nuclides used in nuclear medicine

June 1, 2018
Author(s)
Denis E. Bergeron, Jeffrey T. Cessna
Most clinical measurements of radioactivity, whether for therapeutic or imaging nuclides, rely on commercial reentrant ionization chambers (“dose calibrators”). The National Institute of Standards and Technology (NIST) maintains a battery of representative
Displaying 2801 - 2825 of 4199
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