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NIST Authors in Bold

Displaying 1226 - 1250 of 4634

Field-induced dehydration and optimal ionic escape paths for C2N membranes

June 11, 2021
Author(s)
Miroslav Barabash, William Gibby, Dmitry Luchinsky, Binquan Luan, Alexander Smolyanitsky, Peter McClintock
… Most analytic theories describing electrostatically driven ion transport through water-filled nanopores assume that the … the specific field-induced phenomena arising during ion transport. Here we consider an atomistic model of electrostatically driven ion permeation through subnanoporous C2N membranes. We …

Microfabricated Atomic Clocks and Magnetometers

August 1, 2005
Author(s)
Svenja A. Knappe, P Schwindt, Vladislav Gerginov, V Shah, Hugh Robinson
We describe recent research at NIST directed towards the development of microfabricated atomic clocks and magnetometers based on coherent population trapping spectroscopy. Clock physics packages based on the D1 transition in 87Rb achieve a fractional

Calibration of Thin Heat Flux Sensors for Building Applications Using ASTM C 1130

May 1, 2001
Author(s)
Robert R. Zarr, V Martinez-Fuentes, James J. Filliben, Brian P. Dougherty
Calibration measurements of thin heat flux sensors for building applications are presented. The findings support the continued development of precision and bias statements for ASTM Practice C 1130. Measurements have been conducted using a 1016 mm diameter

Isotopic Ratio Measurements by Time-of-Flight Secondary Ion Mass Spectrometry

July 1, 2001
Author(s)
Albert J. Fahey, S R. Messenger
… Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is often considered … synonymous with SIMS in the static limit where the ion fluence on the sample surface is so low that damage is … been ruled out. However, the high spatial resolution Ga+ ion beams typically used in ToF-SIMS make it a potentially …

Ultrashallow Depth Profiling with Time-of-flight Secondary Ion Mass Spectrometry

January 1, 1994
Author(s)
J. Bennett, John A. Dagata
… Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is an efficient, sensitive … of TOF-SIMS ultrashallow depth profiling is demonstrated ion GaAs substrates that were passivated with P2S5 solutions … Ultrashallow Depth Profiling with Time-of-flight Secondary Ion Mass Spectrometry …

Varieties of Hyphenated Gas Chromatography with Mass Spectrometry

June 4, 2014
Author(s)
Thomas J. Bruno
… and that are highly specific in research settings (such as ion cyclotron mass spectrometry, and combined quadrupoles … quad, and the various hybrid sector-quad-time of flight-ion trap combinations) that are used in fundamental ion chemistry …

An Unconventional Tradespace of Focused-Ion-Beam Machining

June 20, 2022
Author(s)
Andrew Madison, John S. Villarrubia, Kuo-Tang Liao, Joshua Schumacher, Kerry Siebein, Robert Ilic, James Alexander Liddle, Samuel M. Stavis
… focused-ion-beam machining, resolution, throughput, chromia, silica … An Unconventional Tradespace of Focused-Ion-Beam Machining …

Quantum Teleportation with Atomic Qubits

October 16, 2008
Author(s)
J Chiaverini, T Schaetz, Joseph W. Britton, Wayne M. Itano, John D. Jost, Emanuel Knill, C. Langer, Dietrich Leibfried, R Ozeri, David J. Wineland

Chip-scale atomic magnetometer

December 27, 2004
Author(s)
P Schwindt, Svenja A. Knappe, V Shah, Leo W. Hollberg, John Kitching, Li-Anne Liew, John Moreland
Using the techniques of micro-electro-mechanical systems (MEMS), we have constructed a small, low-power magnetic sensor based on alkali atoms. By measuring the energy shift of the atoms' magnetic moment due to a magnetic field via a coherent population

Uranium Ion Yields from Monodisperse Uranium Oxide Particles

February 24, 2016
Author(s)
Nicholas E. Sharp, John D. Fassett, David S. Simons
… Secondary ion mass spectrometry (SIMS) plays an important role in … isotopic measurements. The influence of primary ion beam species and polarity on U+ sample utilization … [2]. However, the effect of sample substrate on uranium ion production efficiency and sputtering profile has not been …

Magneto-optical trapping using planar optics

January 29, 2021
Author(s)
William McGehee, Wenqi Zhu, Daniel Barker, Daron Westly, Alexander Yulaev, Nikolai Klimov, Amit Agrawal, Stephen Eckel, Vladimir Aksyuk, Jabez McClelland
… Magneto-optical trapping using planar optics …

High-Resolution Structural Study of Zinc Ion Incorporation at the Calcite Cleavage Surface

October 12, 2021
Author(s)
L Cheng, N Sturchio, Joseph Woicik, K Kemner, P Lyman, Michael Bedzyk
… used to determine the atomic-scale structure of the Zn 2+ ion incorporated at the CaCO 3 (1014) surface by adsorption … Zn-O nearest-neighbor distance. Relaxation of the Zn 2+ ion in the out-of-plane direction is indicated by the … High-Resolution Structural Study of Zinc Ion Incorporation at the Calcite Cleavage Surface …
Displaying 1226 - 1250 of 4634
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