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NIST Authors in Bold

Displaying 626 - 650 of 3086

Ion-beam radiation damage to DNA by investigation of free radical formation and base damage

March 1, 2020
Author(s)
Melis Kant, Pawel Jaruga, Erdem Coskun, Samuel Ward, Alexander Stark, David Becker, Amitav Adhikary, Michael Sevilla, Miral M. Dizdar
… processes and DNA base products involved in Ne-22 ion- beam (ca. 1.4 GeV) radiation damage to hydrated (12 … x 1 mm) samples were stacked in a sample packet and then ion-beam irradiated at 77 K. Free radicals trapped in ion- beam irradiated DNA at 77 K were elucidated using ESR …

Field-induced dehydration and optimal ionic escape paths for C2N membranes

June 11, 2021
Author(s)
Miroslav Barabash, William Gibby, Dmitry Luchinsky, Binquan Luan, Alexander Smolyanitsky, Peter McClintock
… Most analytic theories describing electrostatically driven ion transport through water-filled nanopores assume that the … the specific field-induced phenomena arising during ion transport. Here we consider an atomistic model of electrostatically driven ion permeation through subnanoporous C2N membranes. We …

Frequency Comparison of Two High-Accuracy Al+ Optical Clocks

February 17, 2010
Author(s)
Chin-Wen Chou, David Hume, J.C. Koelemeij, David J. Wineland, Till P. Rosenband
… of 8.6e-18, based on quantum logic spectroscopy of an Al+ ion. A simultaneously trapped Mg+ ion serves to sympathetically laser-cool the Al+ ion and detect its quantum state. The frequency of the … atomic clock, optical clock, high accuracy, aluminum ion, quantum logic …

Quantum information processing and quantum control with trapped atomic ions

December 14, 2009
Author(s)
David J. Wineland
… The role of trapped atomic ions in the field of quantum information processing is … discuss some of the historical developments that enabled ions to enter the field and then summarize the basic … processing and quantum control with trapped atomic ions …

Influence of the heat-treatment conditions, microchemistry, and microstructure on the irreversible strain limit of a selection of Ti-doped internal-tin Nb 3 Sn ITER wires

August 19, 2014
Author(s)
Najib Cheggour, Loren F. Goodrich, Z-H Sung, Theodore C. Stauffer, Jolene D. Splett, P. J. Lee, Matthew C. Jewell
… and microchemistry were made on several internal-tin Nb 3 Sn pre-production wires fabricated for the domestic … strain limit of a selection of Ti-doped internal-tin Nb 3 Sn ITER wires …

Isotopic Ratio Measurements by Time-of-Flight Secondary Ion Mass Spectrometry

July 1, 2001
Author(s)
Albert J. Fahey, S R. Messenger
… Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is often considered … synonymous with SIMS in the static limit where the ion fluence on the sample surface is so low that damage is … been ruled out. However, the high spatial resolution Ga+ ion beams typically used in ToF-SIMS make it a potentially …

Preparation of entangled states through Hilbert space engineering

September 28, 2016
Author(s)
Yiheng Lin, John P. Gaebler, Florentin Reiter, Ting R. Tan, Ryan S. Bowler, Yong Wan, Adam C. Keith, Emanuel Knill, Kevin Coakley, Dietrich Leibfried, David J. Wineland, Scott Glancy
… such as fluctuations in laser intensity and frequency, and ion-motion frequencies. …

Tunnel junction sensors for HCI-surface measurements at low kinetic energies

January 25, 2013
Author(s)
Joshua M. Pomeroy, Russell E. Lake
… created by particle surface interactions. Highly charged ion (HCI) produced nanofeatures have been the focus of our … due a direct vacuum connection to the NIST electron beam ion trap (EBIT). Using these sensors, we have been able to … Highly charged ions, electron beam ion trap, tunnel junction sensors, stopping power …

Ultrashallow Depth Profiling with Time-of-flight Secondary Ion Mass Spectrometry

January 1, 1994
Author(s)
J. Bennett, John A. Dagata
… Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is an efficient, sensitive … of TOF-SIMS ultrashallow depth profiling is demonstrated ion GaAs substrates that were passivated with P2S5 solutions … Ultrashallow Depth Profiling with Time-of-flight Secondary Ion Mass Spectrometry …

An Unconventional Tradespace of Focused-Ion-Beam Machining

June 20, 2022
Author(s)
Andrew Madison, John S. Villarrubia, Kuo-Tang Liao, Joshua Schumacher, Kerry Siebein, Robert Ilic, James Alexander Liddle, Samuel M. Stavis
… focused-ion-beam machining, resolution, throughput, chromia, silica … An Unconventional Tradespace of Focused-Ion-Beam Machining …

Effects of an Oscillating Electric Field on and Dipole Moment Measurement of a Single Molecular Ion

May 31, 2023
Author(s)
Alejandra Collopy, Julian Schmidt, Dietrich Leibfried, David Leibrandt, Chin-wen Chou
… (rf) electric field experienced by a molecular ion in an rf Paul trap, a leading systematic in the … uncertainty of the field-free rotational transition. The ion is deliberately displaced to sample different known rf … comb which probes rotational transitions in the molecular ion. With improved coherence of the comb laser, a fractional …

Coherently displaced oscillator quantum states of a single trapped atom

June 11, 2019
Author(s)
Katherine C. McCormick, Jonas Keller, David J. Wineland, Andrew C. Wilson, Dietrich Leibfried
… harmonic oscillator number states of a harmonically bound ion can be coupled to two internal states of the ion by a laser-induced motional sideband interaction. The … detuning of the displacement drive with respect to the ion's motional frequency. We precisely characterize the …

Uranium Ion Yields from Monodisperse Uranium Oxide Particles

February 24, 2016
Author(s)
Nicholas E. Sharp, John D. Fassett, David S. Simons
… Secondary ion mass spectrometry (SIMS) plays an important role in … isotopic measurements. The influence of primary ion beam species and polarity on U+ sample utilization … [2]. However, the effect of sample substrate on uranium ion production efficiency and sputtering profile has not been …

The NIST EBIT; A Progress Report

January 1, 1993
Author(s)
John D. Gillaspy, J R. Roberts, Craig M. Brown, Uri Feldman
… (1993 publication) The invention of the Electron Beam Ion Trap (EBIT) at Livermore has marked the emergence of a … atoms, EBIT, electron beam ion trap, highly charged atoms …

High-Resolution Structural Study of Zinc Ion Incorporation at the Calcite Cleavage Surface

October 12, 2021
Author(s)
L Cheng, N Sturchio, Joseph Woicik, K Kemner, P Lyman, Michael Bedzyk
… used to determine the atomic-scale structure of the Zn 2+ ion incorporated at the CaCO 3 (1014) surface by adsorption … Zn-O nearest-neighbor distance. Relaxation of the Zn 2+ ion in the out-of-plane direction is indicated by the … High-Resolution Structural Study of Zinc Ion Incorporation at the Calcite Cleavage Surface …
Displaying 626 - 650 of 3086
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