June 30, 2025
Author(s)
Chowdhury Abrar Faiyaz, Endre Takacs, Timothy Burke, FNU Dipti, Galen O'Neil, Adam Hosier, Hunter Staiger, Joseph Tan, Yuri Ralchenko
… and spectral features of ions in electron beam ion trap (EBIT) devices. Ladder ionization with intermediate … Nd ions, we show that these processes significantly alter ion populations and spectra, emphasizing the importance of … Plasma diagnostics - charged-particle spectroscopy, Ion sources (positive ions, negative ions, electron cyclotron …