Impact of Ni-like metastable states and hyperfine quenching on charge state distribution in an EBIT

Published

June 30, 2025

Author(s)

Chowdhury Abrar Faiyaz, Endre Takacs, Timothy Burke, FNU Dipti, Galen O'Neil, Adam Hosier, Hunter Staiger, Joseph Tan, Yuri Ralchenko

Abstract

We show the effects of ladder ionization and hyperfine quenching on charge state distributions and spectral features of ions in electron beam ion trap (EBIT) devices. Ladder ionization with intermediate excitation of metastable states proceeds at lower than ionization potential electron beam energies, while hyperfine quenching reduces the lifetimes of these states by enhancing particular decay channels through nuclear-electronic coupling. Using Ni-like Pr and Nd ions, we show that these processes significantly alter ion populations and spectra, emphasizing the importance of incorporating hyperfine level specific modeling in EBIT studies.

Citation

Journal of Instrumentation

Pub Type

Journals

Download Paper

https://doi.org/10.1088/1748-0221/20/06/C06068

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Keywords

X-ray detectors, X-ray generators and sources, Plasma diagnostics - charged-particle spectroscopy, Ion sources (positive ions, negative ions, electron cyclotron resonance (ECR), electron beam (EBIS))

Citation

Faiyaz, C. , Takacs, E. , Burke, T. , Dipti, F. , O'Neil, G. , Hosier, A. , Staiger, H. , Tan, J. and Ralchenko, Y. (2025), Impact of Ni-like metastable states and hyperfine quenching on charge state distribution in an EBIT, Journal of Instrumentation, [online], https://doi.org/10.1088/1748-0221/20/06/C06068, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=959504 (Accessed July 15, 2025)