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Displaying 1126 - 1150 of 2769

Manipulating Interface Magnetism in Manganite Thin Film Membranes by Substrate Surface Chemistry

November 13, 2024
Author(s)
Purnima P. Balakrishnan, Qinwen Lu, Qing Wang, Shinichiro N. Muramoto, Paige Quarterman, Michael R. Fitzsimmons, Timothy R. Charlton, Xiaofang Zhai, Alexander Grutter
… work, we use polarized neutron reflectometry and secondary ion mass spectroscopy to provide a detailed understanding of … magnetism, polarized neutron reflectometry, secondary ion mass spectroscopy …

Miniature all-solid-state heterostructure nanowire Li-ion batteries as a tool for engineering and structural diagnostics of nanoscale electrochemical processes.

August 15, 2014
Author(s)
Vladimir P. Oleshko, Thomas F. Lam, Dmitry A. Ruzmetov, Paul M. Haney, Henri J. Lezec, Albert Davydov, Sergiy Krylyuk, John Cumings, Albert A. Talin
… and phase transformations that govern the operation of Li-ion batteries (LiBs) require detailed nanoscale 3D structural … Miniature all-solid-state heterostructure nanowire Li-ion batteries as a tool for engineering and structural …

Combining secondary ion mass spectrometry image depth profiling and single particle inductively coupled plasma mass spectrometry to investigate the uptake and biodistribution of gold nanoparticles in Caenorhabditis elegans

May 20, 2021
Author(s)
Monique Johnson, Joe Bennett, Antonio Montoro Bustos, Shannon Hanna, Andrei Kolmakov, Nicholas Sharp, Elijah Petersen, Christopher Sims, Bryant Nelson, Patricia Lapasset
… assessments. Here, we combine the use of dynamic secondary ion mass spectrometry (dynamic SIMS) and single particle … Combining secondary ion mass spectrometry image depth profiling and single …

Comparison of Submicron Particle Analysis by Auger Electron Spectroscopy, Time-of-Flight Secondary Ion Mass Spectrometry, and Secondary Electron Microscopy With Energy Dispersive X-Ray Spectroscopy.

July 31, 1996
Author(s)
George W. Mulholland, K D. Childs, D Narum, L A. LaVanier, P M. Lindley, B W. Schueler, A C. Diebold
… of Auger electron spectroscopy, time-of-flight secondary ion mass spectrometry, and energy dispersive x-ray … by Auger Electron Spectroscopy, Time-of-Flight Secondary Ion Mass Spectrometry, and Secondary Electron Microscopy With …

Quantum Projection Noise: Population Fluctuations in 2-Level Systems

January 1, 1993
Author(s)
Wayne M. Itano, James C. Bergquist, John J. Bollinger, J M. Gilligan, D J. Heinzen, F L. Moore, M G. Raizen, David J. Wineland
… are available. In the experiments described here, a single ion or a few identical ions were prepared in well-defined … of the energy levels were then measured. For an individual ion, the outcome of the measurement is uncertain, unless the …
Displaying 1126 - 1150 of 2769
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