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Displaying 2101 - 2125 of 4260

Letter in response to V. Stodden et al., Science 354, 1240 (2016).

January 2, 2018
Author(s)
Mark W. Maciejewski, Adam D. Schuyler, Michael R. Gryk, Ion I. Moraru, Pedro R. Romero, Eldon L. Ulrich, Hamid R. Eghbalnia, Miron Livny, Frank Delaglio, Jeffrey C. Hoch
… Mark W. Maciejewski, Adam D. Schuyler, Michael R. Gryk, Ion I. Moraru, Pedro R. Romero, Eldon L. Ulrich, Hamid R. …

NMRbox: A Resource for Biomolecular NMR Computation

May 25, 2017
Author(s)
Mark W. Maciejewski, Adam D. Schuyler, Michael R. Gryk, Ion I. Moraru, Pedro R. Romero, Eldon L. Ulrich, Hamid R. Eghbalnia, Miron Livny, Frank Delaglio, Jeffrey C. Hoch
… Mark W. Maciejewski, Adam D. Schuyler, Michael R. Gryk, Ion I. Moraru, Pedro R. Romero, Eldon L. Ulrich, Hamid R. …

Interconversion of Peptide Mass Spectral Libraries Derivatized with iTRAQ or TMT Labels

July 7, 2016
Author(s)
Zheng Zhang, Xiaoyu Yang, Yuri A. Mirokhin, Dmitrii V. Tchekhovskoi, Weihua Ji, Sanford P. Markey, Pedatsur Neta, Bowen A. Michael, Stephen E. Stein
Derivatizing peptides with isobaric tags such as iTRAQ and TMT is widely employed in proteomics due to their ability to multiplex quantitative measurements. We recently made publicly available a large peptide library derived from iTRAQ 4-plex labeled

Gold Nanoparticle Quantitation by Whole Cell Tomography

November 13, 2015
Author(s)
Aric W. Sanders, Kavita M. Jeerage, Cindi Schwartz, Alexandra Curtin, Ann C. Chiaramonti Debay
… mammalian stem cells was characterized using fast focused ion beam-scanning electron microscopy based tomography. … Cells were then serially sectioned using a gallium ion beam and imaged using a scanning electron beam. To … using transmission electron microscopy and scanning helium ion microscopy. Complete tomographic series were then used to …

Gate Dielectric Thickness Metrology Using Transmission Electron Microscopy

January 1, 2000
Author(s)
J H. Scott, Eric S. Windsor, D Brady, J Canterbury, A. Karamcheti, W Chism, A C. Diebold
… x-ray photoelectron spectroscopy, and medium energy ion scattering. Silicon oxynitride films were grown by … Cross sectional TEM samples were prepared by dimpling/ion milling and HRTEM micrographs were acquired at 297 keV … the cross section glue line and both sides of the dimple/ion mill perforation. Statistical analysis of the HRTEM …

NIST transactive energy modeling and simulation challenge phase II final report:

May 1, 2019
Author(s)
David Holmberg, Martin Burns, Steven Bushby, Avi Gopstein, Tom McDermott, Yingying Tang, Qiuhua Huang, Annabelle Pratt, Mark Ruth, Fei Ding, Yogesh Bichpuriya, Narayanan Rajagopal, Marija Ilic, Rupamathi Jaddivada, Himanshu Neema
… transactive energy modeling and simulation challenge phase II final report: …
Displaying 2101 - 2125 of 4260
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