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Displaying 1226 - 1250 of 3757

Maximizing Information Obtained From Secondary Ion Mass Spectra of Organic Thin Films Using Multivariate Analysis.

July 1, 2004
Author(s)
M S. Wagner, D G. Graham, B D. Ratner, David G. Castner
… Time -of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) can give detailed … molecular depth profiles obtained using an SF 5u+ primary ion beam. The effect of data normalization and scaling on the … Maximizing Information Obtained From Secondary Ion Mass Spectra of Organic Thin Films Using Multivariate …

Nanocalorimetry for plasma metrology relevant to semiconductor fabrication

February 4, 2025
Author(s)
John Diulus, Carles Corbella Roca, Feng Yi, David LaVan, Berc Kalanyan, Mark McLean, Lakshmi Ravi Narayan, William Osborn, James Maslar, Andrei Kolmakov
… parasitic stimuli such as IR/visible/UV radiation and ion or electron fluxes. The system was successfully tested in a hydrogen plasma environment, and key performance metrics such …

Characterization of Emerging Ambient Pressure Mass Spectrometric Techniques using Time-of-Flight Secondary Ion Mass Spectrometry

March 28, 2014
Author(s)
Shinichiro Muramoto, Thomas P. Forbes, Matthew E. Staymates, John G. Gillen
… Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used to characterize the … angles also corresponded with higher relative secondary ion yields as measured by ambient MS and ToF-SIMS. For LTP, a … oblique angles corresponded with higher relative secondary ion yields, although the analyte did not display a distinct …

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for High-Throughput Characterization of Bio-Surfaces

January 1, 2003
Author(s)
S V. Roberson, A Sehgal, Albert J. Fahey, Alamgir Karim
… film. In this pre-liminary work, we tracked the secondary ion intensities of various species along the 45 mm length of … film. We noticed consistent trends, with the secondary ion signals for oxidized species steadily increasing with the … Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for High-Throughput …

Application of Inkjet Printing Technology to Produce Test Materials of 1,3,5-Trinitro-1,3,5 Triazcyclohexane for Trace Explosive Analysis

October 15, 2010
Author(s)
Eric S. Windsor, Marcela N. Najarro, Anna N. Bloom, Bruce A. Benner Jr, Robert A. Fletcher, John G. Gillen, Richard Lareau, Inho Cho, Mike Boldmand
… and jetted onto substrates suitable for calibration of the ion mobility spectrometry (IMS) instruments currently … explosives, inkjet printing, ion mobility spectrometry, trace explosives detection …

Microwaves in Quantum Computing

January 29, 2021
Author(s)
Joseph C. Bardin, Daniel Slichter, David J. Reilly
… three leading quantum computing platforms: trapped atomic ion qubits, spin qubits in semiconductors, and …

The g Factor of the Bound Electron in Hydrogenlike Carbon

January 1, 2001
Author(s)
H Haeffner, N Hermanspahn, H -. Kluge, G Marx, W Quint, S Stahl, T Valenzuela, G Verdu, G Werth
… of the magnetic moment of the bound electron in hydrogen-like ions is an important test of the theory of … effects.In our experiment a single hydrogenlike carbon-ion is stored in a Penning trap, which consists of a strong … (p -16 mbar) the storage time of the hydrogenlike carbon-ion is longer than one year. A new measurement technique has …
Displaying 1226 - 1250 of 3757
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