Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 701 - 725 of 2915

Fundamentals of the Reaction-Diffusion Process in Model EUV Photoresists

March 1, 2006
Author(s)
Kristopher Lavery, George Thompson, Hai Deng, D S. Fryer, Kwang-Woo Choi, B D. Vogt, Vivek Prabhu, Eric K. Lin, Wen-Li Wu, Sushil K. Satija, Michael Leeson, Heidi B. Cao
… reflectivity, photolithography … Proceedings of SPIE … Fundamentals of the Reaction-Diffusion Process in Model EUV …

An absolute cavity pyrgeometer to measure the absolute outdoor longwave irradiance with traceability to International System of Units, SI

March 1, 2012
Author(s)
Ibrahim Reda, Jinan Zeng, Jonathan Scheuch, Leonard Hanssen, Daryl Myers, Boris Wilthan, Tom Stoffel
This article describes a method of measuring the absolute outdoor longwave irradiance using an absolute cavity pyrgeometer (ACP). The ACP consists ofa domeless thermopile pyrgeometer, gold- plated concentrator, temperature controller, and data acquisition
Displaying 701 - 725 of 2915
Was this page helpful?