U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 1051 - 1075 of 3311

Recent developments in the NIST Atomic Databases

May 11, 2011
Author(s)
Alexander Kramida
… In particular, the data on highly ionized tungsten (W III–LXXIV) have been added from a recently published NIST … updated or new spectra include H, D, T, He I–II, Li I–III, Be I–IV, B I–V, C I–II, N I–II, O I–II, Na I–X, K I–XIX, …

Cure temperature influences electrical properties via carbon nanotube-rich domain formation

July 27, 2016
Author(s)
Chelsea S. Davis, Nathan D. Orloff, Jeremiah W. Woodcock, Christian J. Long, Kevin A. Twedt, Bharath NMN Natarajan, Jonathan E. Seppala, Jabez J. McClelland, Jan Obrzut, James A. Liddle, Jeffrey W. Gilman
… metrology techniques such as scanning lithium-ion microscopy and microwave cavity perturbation, new … aggregation, carbon nanotubes, dispersion, ion microscopy, metrology, microwave, nanocomposites, …

Chip-Scale Atomic Frequency References

September 16, 2005
Author(s)
John E. Kitching, Svenja A. Knappe, Li-Anne Liew, P Schwindt, Vladislav Gerginov, V Shah, John Moreland, Alan Brannon, J Breitbarth, Z Popovic, Leo W. Hollberg
… Proc. 2005 ION-GNSS Conf. …

Effect of Tin Doping on alpha-Fe2O3 Photoanodes for Water Splitting

June 28, 2012
Author(s)
Christopher C. Bohn, Amit Agrawal, Erich C. Walter, Mark D. Vaudin, Andrew Herzing, Paul M. Haney, Albert A. Talin, Veronika Szalai
… oxide (FTO) interface and was quantified using secondary ion mass spectrometry (SIMS) to give a mole fraction of … electrochemical impedance spectroscopy, dynamic secondary ion mass spectrometry …
Displaying 1051 - 1075 of 3311
Was this page helpful?